參數(shù)資料
型號(hào): ISPPAC-CLK5316S-01TN64I
廠商: Lattice Semiconductor Corporation
文件頁(yè)數(shù): 31/56頁(yè)
文件大?。?/td> 0K
描述: IC CLOCK PROGRAM BUFFER 64TQFP
標(biāo)準(zhǔn)包裝: 160
系列: ispClock™
類型: 時(shí)鐘發(fā)生器,扇出配送,零延遲緩沖器
PLL: 帶旁路
輸入: HSTL,LVCMOS,LVDS,LVPECL,LVTTL,SSTL
輸出: eHSTL,HSTL,LVCMOS,LVTTL,SSTL
電路數(shù): 1
比率 - 輸入:輸出: 2:16
差分 - 輸入:輸出: 是/無(wú)
頻率 - 最大: 267MHz
除法器/乘法器: 是/無(wú)
電源電壓: 3 V ~ 3.6 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 64-LQFP
供應(yīng)商設(shè)備封裝: 64-TQFP(10x10)
包裝: 托盤(pán)
Lattice Semiconductor
ispClock5300S Family Data Sheet
37
Figure 32. ispClock5300S TAP Registers
TAP Controller Specics
The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether
an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a
small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as
shown in Figure 33. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO)
becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, Run-
Test/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But
there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a
reset of the test logic within ve TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on
default state.
Address Register (10 Bits)
E2CMOS
Non-Volatile
Memory
UES Register (32 Bits)
IDCODE Register (32 Bits)
Bypass Register (1 Bit)
Instruction Register (8 Bits)
Test Acess Port (TAP)
Logic
Output
Latch
TDI
TCK
TMS
TDO
Multiplexer
Data Register
(42 Bits for ispClock5312S, 5308S 5304S,
61 Bits for ispClock5320S and 5316S)
Boundary Scan Register
(34 Bits for ispClock5312S, 5308S, 5304S,
50 Bits for ispClock5320S and 5316S)
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