參數(shù)資料
型號: KAD5610P-25Q72
廠商: Intersil
文件頁數(shù): 8/30頁
文件大?。?/td> 0K
描述: IC ADC 10BIT 250MSPS DUAL 72-QFN
產(chǎn)品培訓模塊: High-Speed Analog-to-Digital Converters
標準包裝: 1
系列: FemtoCharge™
位數(shù): 10
采樣率(每秒): 250M
數(shù)據(jù)接口: 串行,SPI?
轉(zhuǎn)換器數(shù)目: 2
功率耗散(最大): 438mW
電壓電源: 單電源
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 72-VFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 72-QFN(10x10)
包裝: 托盤
輸入數(shù)目和類型: 2 個差分,單極
16
FN6810.2
September 10, 2009
An RF transformer will give the best noise and distortion
performance for wideband and/or high intermediate
frequency (IF) inputs. Two different transformer input
schemes are shown in Figures 27 and 28.
This dual transformer scheme is used to improve common-
mode rejection, which keeps the common-mode level of the
input matched to VCM. The value of the shunt resistor
should be determined based on the desired load impedance.
The differential input resistance of the KAD5610P is 1000
Ω.
The SHA design uses a switched capacitor input stage
(see Figure 42), which creates current spikes when the
sampling capacitance is reconnected to the input voltage.
This causes a disturbance at the input which must settle
before the next sampling point. Lower source impedance will
result in faster settling and improved performance. Therefore
a 1:1 transformer and low shunt resistance are
recommended for optimal performance.
A differential amplifier, as shown in Figure 29, can be used in
applications that require DC-coupling. In this configuration
the amplifier will typically dominate the achievable SNR and
distortion performance.
Clock Input
The clock input circuit is a differential pair (see Figure 43).
Driving these inputs with a high level (up to 1.8VP-P on each
input) sine or square wave will provide the lowest jitter
performance. A transformer with 4:1 impedance ratio will
provide increased drive levels.
The recommended drive circuit is shown in Figure 30. A duty
range of 40% to 60% is acceptable. The clock can be driven
single-ended, but this will reduce the edge rate and may
impact SNR performance. The clock inputs are internally
self-biased to AVDD/2 to facilitate AC coupling.
A selectable 2x frequency divider is provided in series with
the clock input. The divider can be used in the 2x mode with
a sample clock equal to twice the desired sample rate. This
allows the use of the Phase Slip feature, which enables
synchronization of multiple ADCs.
The clock divider can also be controlled through the SPI
port, which overrides the CLKDIV pin setting. Details on this
A delay-locked loop (DLL) generates internal clock signals
for various stages within the charge pipeline. If the frequency
of the input clock changes, the DLL may take up to 52ìs to
regain lock at 250MSPS. The lock time is inversely
proportional to the sample rate.
Jitter
In a sampled data system, clock jitter directly impacts the
achievable SNR performance. The theoretical relationship
between clock jitter (tJ) and SNR is shown in Equation 1 and
is illustrated in Figure 31.
FIGURE 27. TRANSFORMER INPUT FOR GENERAL
PURPOSE APPLICATIONS
ADT1-1WT
0.1F
KAD5610P
VCM
ADT1-1WT
1000pF
FIGURE 28. TRANSMISSION-LINE TRANSFORMER INPUT
FOR HIGH IF APPLICATIONS
ADTL1-12
0.1F
KAD5610P
VCM
ADTL1-12
1000pF
FIGURE 29. DIFFERENTIAL AMPLIFIER INPUT
KAD5610P
VCM
0.1F
0.22F
69.8O
49.9O
100O
69.8O
348O
CM
217O
25O
Ω
TABLE 1. CLKDIV PIN SETTINGS
CLKDIV PIN
DIVIDE RATIO
AVSS
2
Float
1
AVDD
4
FIGURE 30. RECOMMENDED CLOCK DRIVE
TC4-1W
200pF
200O
200pF
CLKP
CLKN
1000pF
Ω
SNR
20 log
10
1
2
πf
IN tJ
--------------------
=
(EQ. 1)
KAD5610P
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