參數(shù)資料
型號: LH52D1000
廠商: Sharp Corporation
英文描述: CMOS 1M (128K x 8) Static Ram
中文描述: 100萬的CMOS(128K的× 8)靜態(tài)RAM
文件頁數(shù): 8/12頁
文件大小: 81K
代理商: LH52D1000
DATA VALID
t
DH
t
DW
WE
D
IN
t
CW
ADDRESS
t
WC
52D1000S-5
t
WR
CE
1
CE
2
t
AS
t
WZ
t
WP
(NOTE 2
)
(NOTE 4)
t
WR
(NOTE 3)
D
OUT
(NOTE 6)
(NOTE 1)
t
WR
t
OW
(NOTE 7)
1. A write occurs during the overlap of a LOW CE
1
, a HIGH CE
2
and a LOW WE,
A write begins at the latest transition among CE
1
going LOW, CE
2
going HIGH
and WE going LOW. A write ends at the earliest transition among CE
1
going
HIGH. CE
2
going LOW and WE going HIGH. t
WP
is measured from the beginning
of write to the end of write.
2. t
CW
is measured from the later of CE
1
going LOW or CE
2
going HIGH to the
end of write.
3. t
AS
is measured from the address valid to the beginning of write.
4. t
WR
is measured from the end of write to the address change. t
WR1
applies
in case a write ends at CE
1
or WE going HIGH. t
WR2
applies in case a write
ends at CE
2
going LOW.
5. During this period, I/O pins are in the output state, therefore the input signals
of opposite phase to the outputs must not be applied.
6. If CE
1
goes LOW simultaneously with WE going LOW or after WE going LOW,
the outputs remain in high impedance state.
7. If CE
1
goes HIGH simulaneously with WE going HIGH or before WE going HIGH,
the outputs remain in high impedance state.
NOTES:
t
CW
(NOTE 2
)
(NOTE 5)
Figure 5. Write Cycle (OE Low Fixed)
LH52D1000
CMOS 1M (128K
×
8) Static RAM
8
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