參數(shù)資料
型號: M7040N-083ZA1T
廠商: 意法半導體
英文描述: CAP 5600PF 100V 10% X7R AXIAL BULK P-MIL-PRF-39014
中文描述: 64K的× 72位的網絡數(shù)據(jù)包進入搜索引擎
文件頁數(shù): 21/159頁
文件大?。?/td> 1088K
代理商: M7040N-083ZA1T
21/159
M7040N
Full In (FULI[6:0]).
Each signal in this bus is con-
nected to FULO[0] or FULO[1] of an upstream de-
vice to generate the FULL signal for the depth-
cascaded
block.
For
DEPTH-CASCADING, page 124 to Generate Full
for a Block Section.
Full Out (FULO[1:0]).
FULO[1] and FULO[0] are
the same logical signal. One of these two signals
must be connected to the FULI of up to four down-
stream devices in a depth-cascaded table. Bit [0]
in the data array indicates if the entry is full (1) or
empty (0).This signal is asserted if all of the bits in
the data array are '1s.' Refer to Depth-Cascading
to Generate a
FULL
Signal, page 124.
Full Flag (FULL).
When asserted, this signal in-
dicates that the table consisting of many depth-
cascaded devices is full.
Device Identification (ID[4:0]).
The
coded device ID for a depth-cascaded system
starts at 00000 and goes up to 11110. 11111 is re-
more
information,
see
binary-en-
served for a special broadcast address that se-
lects all cascaded search engines in the system.
On a broadcast read-only, the device with the
LDEV bit set to '1' responds.
Chip Core Supply (V
DD
).
This is equal to 1.5V.
Chip I/O Supply (V
DDQ
).
This is equal to either
2.5 or 3.3V.
Test Data In (TDI).
This is the Test Access Port
s
Test Data In.
Test Clock (TCK).
This is the Test Access Port
s
Test Clock.
Test Data Out (TDO).
This is the Test Access
Port
s Test Data Out.
Test Mode Select (TMS).
This is the Test Ac-
cess Port
s Test Mode Select.
Test Reset (TRST_L).
This is the Test Access
Port
s Test Reset.
CLOCKS
If the CLK_MODE pin is low, M7040N receives the
CLK2X and PHS_L signals. It uses the PHS_L sig-
nal to divide CLK2X and generate an internal clock
(CLK), as shown in Figure 10. The M7040N uses
CLK2X and CLK for internal operations. If the
CLK_MODE pin is high, the M7040N receives the
CLK1X only. the M7040N uses an internal PLL to
double the frequency of CLK1X and then divides
that clock by two to generate a CLK for internal op-
erations, as shown in Figure 11.
Note:
For the purpose of showing timing dia-
grams, all such diagrams in this document will be
shown in CLK2X mode. For a timing diagram in
CLK1X mode, the following substitution can be
made (see Figure 12).
Figure 10. Clocks (CLK2X and PHS_L)
Note: Any reference to
CLK Cycles
means 1 cycle of the signal,
CLK.
1.
CLK
is an internal signal.
Figure 11. Clocks (CLK1X)
1.
CLK
is an internal signal.
CLK2X
PHS_L
CLK(1)
AI04750
CLK1X
CLK(1)
AI04665
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