參數(shù)資料
型號： MACH131SP-15YC
廠商： LATTICE SEMICONDUCTOR CORP
元件分類： PLD
英文描述： High-Performance EE CMOS Programmable Logic
中文描述： EE PLD, 15 ns, PQFP100
封裝： PLASTIC, QFP-100
文件頁數(shù)： 17/47頁
文件大?。?/td> 1200K
代理商： MACH131SP-15YC
24
MACH 1 & 2 Families
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65
°C to +150°C
Ambient Temperature
With Power Applied . . . . . . . . . . . . . .-55
°C to +125°C
Device Junction Temperature . . . . . . . . . . . . . +150
°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . -0.5 V to VCC +0.5 V
DC Output or I/O Pin Voltage . . -0.5 V to VCC +0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (TA = -40°C to +85°C). . . . . . . 200 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . . . . 0
°C to +70°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Operating ranges dene those limits between which the func-
tionality of the device is guaranteed.
Industrial (I) Devices
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . . . -40
°C to +85°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges dene those limits between which the
functionality of the device is guaranteed.
DC CHARACTERISTICS OVER OPERATING RANGES
Notes:
1. This applies to MACH111SP, MACH131SP, and die code “B” or later for MACH211(SP) and MACH231(SP). This does not apply
to MACH111, MACH131, MACH221(SP), and die code “A” for MACH211(SP) and MACH231(SP).
2. Total IOL for one PAL block should not exceed 64 mA.
3. These are absolute values with respect to device ground, and all overshoots due to system and/or tester noise are included.
4. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
5. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
6. For commercial temperature range only.
Parameter
Symbol
Parameter Description
Test Description
Min
Typ
Max
Unit
VOH
Output HIGH Voltage
IOH = –3.2 mA, VCC = Min, VIN = VIH or VIL
2.4
V
IOH = –300 A, VCC = Max, VIN = VIH or VIL (Note 1)
3.5
V
VOL
Output LOW Voltage
IOL = 16 mA, VCC = Min, VIN = VIH or VIL (Note 2)
0.5
V
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH Voltage for all Inputs
(Note 3)
2.0
V
VIL
Input LOW Voltage
Guaranteed Input Logical LOW Voltage for all Inputs
(Note 3)
0.8
V
IIH
Input HIGH Leakage Current
VIN = 5.25 V, V VCC = Max (Note 4)
10
A
IIL
Input LOW Leakage Current
VIN = 0 V, VCC = Max (Note 4)
–10
A
IOZH
Off-State Output Leakage Current HIGH VOUT = 5.25 V, VCC = Max, VIN = VIH or VIL (Note 4)
10
A
IOZL
Off-State Output Leakage Current LOW VOUT = 0 V, VCC = Max, VIN = VIH or VIL (Note 4)
–10
A
ISC
Output Short-Circuit Current
VOUT = 0.5 V VCC = Max (Note 5)
–30
–130 (Note 6),
–160
mA
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