參數(shù)資料
型號: MCZ33889BEG
廠商: 飛思卡爾半導體(中國)有限公司
英文描述: System Basis Chip with Low Speed Fault Tolerant CAN Interface
中文描述: 系統(tǒng)基礎芯片與低速容錯CAN接口
文件頁數(shù): 7/60頁
文件大?。?/td> 705K
代理商: MCZ33889BEG
Analog Integrated Circuit Device Data
Freescale Semiconductor
7
33889
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ESD voltage (HBM 100 pF, 1.5 k)
(3)
CANL, CANH, HS1, L0, L1
RTH, RTL
All other pins
V
ESDH
±4.0
±3.0
±2.0
kV
ESD voltage (Machine Model) All pins, MC33889B
(3)
(4)
V
ESD-MM
±200
V
ESD voltage (CDM) All pins, MC33889D
(4)
Pins 1,14,15, & 28
All other pins
V
ESD-CDM
750
500
V
RTH, RTL Termination Resistance
R
T
500 to 16000
ohms
THERMAL RATINGS
Junction Temperature
T
J
-40 to 150
°C
Storage Temperature
T
S
-55 to 165
°C
Ambient Temperature (for info only)
T
A
-40 to 125
°C
Thermal resistance junction to gnd pin
(5)
R
THJ/P
20
°C/W
Notes:
3.
4.
5.
Testing done in accordance with the Human Body Model (C
ZAP
=100 pF, R
ZAP
=1500 ), Machine Model (C
ZAP
=200 pF, R
ZAP
=0 ).
ESD machine model (MM) is for MC33889B only. MM is now replaced by CDM (Charged Discharged model).
Gnd pins 6,7,8,9,20, 21, 22, 23.
Figure 3. Transient test pulse for L0 and L1 inputs
Table 3. Maximum Ratings (continued)
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Max
Unit
LX
Transient Pulse
Generator
(note)
Gnd
Gnd
1nF
Note: Waveform in accordance to ISO7637 part1, test pulses 1, 2, 3a and 3b.
10 k
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相關代理商/技術參數(shù)
參數(shù)描述
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