參數(shù)資料
型號: MCZ33991EG
廠商: 飛思卡爾半導(dǎo)體(中國)有限公司
英文描述: Gauge Driver Integrated Circuit
中文描述: 儀表驅(qū)動集成電路
文件頁數(shù): 5/36頁
文件大小: 481K
代理商: MCZ33991EG
Analog Integrated Circuit Device Data
Freescale Semiconductor
5
33991
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. 33991 Maximum Ratings
(All voltages are with respect to ground unless otherwise noted)
Rating
Symbol
Value
Limit
Power Supply Voltage
Steady State
V
PWR(SUS)
-0.3 to 41
V
Input Pin Voltage
(1)
V
IN
-0.3 to 7.0
V
SIN+/- COS +/- Continuous Per Output Current
(2)
I
OUTMAX
40
mA
Storage Temperature
T
STG
-55 to 150
°C
Operating Junction Temperature
T
JUNC
-40 to 150
°C
Thermal Resistance (C/W)
Ambient
Junction to Lead
θ
JA
θ
JL
60
20
°C/W
°C/W
ESD Voltage
(3)
Human Body Model
Machine Model
V
ESD1
V
ESD2
T
PPRT
±2000
±200
V
V
°C
Peak Package Reflow Temperature During Reflow
(4)
,
(5)
Note 5
Notes
1.
2.
Exceeding voltage limits on Input pins may cause permanent damage to the device.
Output continuous output rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient temperature
will require maximum output current computation using package thermal resistances
VESD1 testing is performed in accordance with the Human Body Model (Czap = 100pF, Rzap = 1500
), All pins are capable of Human
Body Model RSP voltages of ±2000 V with one exception. The SO pin is capable of ± 1900 V, VESD2 testing is performed in accordance
with the Machine Model (Czap = 200pF, Rzap = 0
)
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),
Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.
MC33xxxD enter 33xxx), and review parametrics.
3.
4.
5.
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