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參數(shù)資料
| 型號： | SAA55XX |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | TV microcontrollers with Closed Captioning (CC) and On-Screen Display (OSD) |
| 中文描述： | 與隱藏字幕（CC）和屏幕顯示（OSD電視微控制器） |
| 文件頁數(shù)： | 75/84頁 |
| 文件大?。?/td> | 352K |
| 代理商： | SAA55XX |
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2000 Feb 23
75
Philips Semiconductors
Preliminary specification
TV microcontrollers with Closed Captioning (CC)
and On-Screen Display (OSD)
SAA55xx
22 QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E” The principal requirements are shown in Tables 30 to 33.
Table 30
Acceptance tests per lot
Table 31
Processability tests (by package family)
Table 32
Reliability tests (by process family)
Table 33
Reliability tests (by device type)
Notes
to Tables 30 to 33
1.
ppm = fraction of defective devices, in parts per million.
2.
FPM = fraction of devices failing at test condition, in Failures Per Million.
3.
FITS = Failures In Time Standard.
TEST
REQUIREMENTS
Mechanical
Electrical
cumulative target: <80 ppm
cumulative target: <100 ppm
TEST
REQUIREMENTS
Solderability
Mechanical
Solder heat resistance
0/16 on all lots
0/15 on all lots
0/15 on all lots
TEST
CONDITIONS
REQUIREMENTS
Operational life
Humidity life
168 hours at T
j
= 150
°
C
temperature, humidity, bias 1000 hours,
85
°
C, 85% RH (or equivalent test)
T
stg(min)
to T
stg(max)
<1000 FPM at T
j
= 150
°
C
<2000 FPM
Temperature cycling
performance
<2000 FPM
TEST
CONDITIONS
REQUIREMENTS
ESD and latch-up
ESD Human body model 100 pF, 1.5 kW 2000 V
ESD Machine model 200 pF, 0 W
latch-up
200 V
100 mA, 1.5
×
V
DD
(absolute maximum)
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