參數(shù)資料
型號： SAK-TC1762-128F80HL
廠商： INFINEON TECHNOLOGIES AG
元件分類： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 80 MHz, MICROCONTROLLER, PQFP176
封裝： PLASTIC, LQFP-176
文件頁數(shù)： 96/114頁
文件大?。?/td> 852K
代理商： SAK-TC1762-128F80HL
TC1762
Electrical Parameters
Preliminary
Data Sheet
78
V1.0, 2008-04
ON resistance of
the transmission
gates in the
analog voltage
path
R
AIN
CC –
1
1.5
k
ON resistance for
the ADC test
(pull-down for
AIN7)
R
AIN7T
CC 200
300
1000
Test feature
available only for
AIN7
Current through
resistance for the
ADC test (pull-
down for AIN7)
I
AIN7T
CC –
15
rms
30
peak
mA
Test feature
available only for
AIN7
1) Voltage overshoot to 4 V are permissible, provided the pulse duration is less than 100
s and the cumulated
summary of the pulses does not exceed 1 h.
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100
s and the cumulated
summary of the pulses does not exceed 1 h.
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoot).
4) If the reference voltage
V
AREF increases or the VDDM decreases, so that VAREF =( VDDM + 0.05 V to
V
DDM + 0.07 V), then the accuracy of the ADC decreases by 4LSB12.
5) If a reduced reference voltage in a range of
V
DDM/2 to VDDM is used, then the ADC converter errors increase.
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to
V
DDM/2 is used, then there are additional decrease in the
ADC speed and accuracy.
6) Current peaks of up to 6 mA with a duration of max. 2 ns may occur
7) TUE is tested at
V
AREF =3.3 V, VAGND = 0 V and VDDM =3.3 V
8) ADC module capability.
9) Not subject to production test, verified by design / characterization.
10) Value under typical application conditions due to integration (switching noise, etc.).
11) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
12) For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
13) The leakage current definition is a continuous function, as shown in Figure 4-3. The numerical values defined
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
14) Only one of these parameters is tested, the other is verified by design characterization.
Table 4-6
ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter
Symbol
Limit Values
Unit
Test Conditions /
Remarks
Min.
Typ.
Max.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SAK-TC1762-128F80HL AC 功能描述:32位微控制器 - MCU 32 BIT SNGL-CHIP 3.3V 80MHz Flash RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時鐘頻率:90 MHz 程序存儲器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
SAK-TC1762-128F80HLAC 制造商:Rochester Electronics LLC 功能描述: 制造商:Infineon Technologies AG 功能描述:
SAK-TC1764-128F80HL 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:SK-TC176x Family Starter Kit
SAK-TC1764-128F80HLAA 制造商:Infineon Technologies AG 功能描述:
SAK-TC1766-192F80HL 制造商:Infineon Technologies AG 功能描述:Tricore,32 bit,1.5MB Flash,80MHz,USB
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