參數(shù)資料
型號(hào): SI5310-EVB
廠商: Silicon Laboratories Inc
文件頁數(shù): 2/26頁
文件大?。?/td> 0K
描述: BOARD EVALUATION FOR SI5310
標(biāo)準(zhǔn)包裝: 1
主要目的: 計(jì)時(shí),時(shí)鐘發(fā)生器
已用 IC / 零件: SI5310
已供物品:
其它名稱: 336-1140
Si5310
10
Rev. 1.3
Table 5. Minimum Jitter Tolerance in Nanoseconds* (MULTSEL = 0, MULTOUT = 600 to 668 MHz)
Frequency (Hz)
37.5–41.75 MHz
Clock Input
75–83.5 MHz
Clock Input
150–167 MHz
Clock Input
300–334 MHz
Clock Input
<300
25.0
25K
1.6
3.2
6.5
16
250K
1.6
3.2
3.0
3.2
>1M
0.3
0.5
*Note: Measured using sinusoidal jitter at stated Test Condition frequency.
Table 6. Minimum Jitter Tolerance in Nanoseconds* (MULTSEL = 1, MULTOUT = 150 to 167 MHz)
Frequency (Hz)
9.375–10.438 MHz
Clock Input
18.75–20.875 MHz
Clock Input
37.5–41.75 MHz
Clock Input
75–83.5 MHz
Clock Input
<300
66.7
6.5K
6.4
13.0
29.0
33.3
65K
1.2
1.9
4.8
325K
1.2
1.9
2.6
>1M
1.2
1.9
*Note: Measured using sinusoidal jitter at stated Test Condition frequency.
Table 7. Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
DC Supply Voltage
VDD
–0.5 to 2.8
V
LVTTL Input Voltage
VDIG
–0.3 to 3.6
V
Differential Input Voltages
VDIF
–0.3 to (VDD+ 0.3)
V
Maximum Current any output PIN
±50
mA
Operating Junction Temperature
TJCT
–55 to 150
°C
Storage Temperature Range
TSTG
–55 to 150
°C
ESD HBM Tolerance (100 pf, 1.5 k
Ω)
CLKIN+, CLKIN–, REFCLK+, REFCLK–,
All other pins
1
1.5
kV
Note: Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation
should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Table 8. Thermal Characteristics
Parameter
Symbol
Test Condition
Value
Unit
Thermal Resistance Junction to Ambient
JA
Still Air
38
°C/W
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