型號: | SN54ABT657A |
廠商: | Texas Instruments, Inc. |
英文描述: | Octal Transceivers With Parity-Generators/Checkers and 3-State Outputs(八收發(fā)器(帶奇偶發(fā)生器/校驗(yàn)器)) |
中文描述: | 八路收發(fā)器與Parity-Generators/Checkers和三態(tài)輸出(八收發(fā)器(帶奇偶發(fā)生器/校驗(yàn)器)) |
文件頁數(shù): | 2/9頁 |
文件大?。?/td> | 219K |
代理商: | SN54ABT657A |
相關(guān)PDF資料 |
PDF描述 |
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SN54ABT8240 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
SN74ABT8240 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
SN54ABT8244 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
SN74ABT8244 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
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SN54ABT657AFK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL TRANSCEIVERS WITH PARITY GENERATORS/CHECKERS AND 3-STATE OUTPUTS |
SN54ABT657AJT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL TRANSCEIVERS WITH PARITY GENERATORS/CHECKERS AND 3-STATE OUTPUTS |
SN54ABT7819 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:512 】 18 】 2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY |
SN54ABT7819GB | 制造商:TI 制造商全稱:Texas Instruments 功能描述:512 】 18 】 2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY |
SN54ABT7819HT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:512 】 18 】 2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY |