參數(shù)資料
型號(hào)： SN74ABT8244
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器))
中文描述： 掃描測(cè)試設(shè)備與八路緩沖器（掃描測(cè)試裝置（帶八緩沖器））
文件頁(yè)數(shù)： 1/19頁(yè)
文件大小： 390K
代理商： SN74ABT8244
SN54ABT8244, SN74ABT8244
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS485 – JULY 1994
Copyright
1994, Texas Instruments Incorporated
3–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
Functionally Equivalent to SN54/74F244
and SN54/74ABT244 in the Normal-
Function Mode
SCOPE
Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The SN54ABT8244 and SN74ABT8244 scan test
devices with octal buffers are members of the
Texas Instruments SCOPE
testability integrated
circuit family. This family of devices supports IEEE
Standard
1149.1-1990
facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
boundary
scan
to
In the normal mode, these devices are functionally equivalent to the SN54/74F244 and SN54/74ABT244 octal
buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the
device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect
the functional operation of the SCOPE
octal buffers.
In the test mode, the normal operation of the SCOPE
octal buffers is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO),
test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such
as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data
outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT8244 is characterized for operation over the full military temperature range of – 55
°
C to 125
°
C.
The SN74ABT8244 is characterized for operation from –40
°
C to 85
°
C.
3 2 1
13 14
5
6
7
8
9
10
11
2A4
TDI
TCK
NC
TMS
TDO
2Y4
1A2
1A1
2OE
NC
1OE
1Y1
1Y2
4
15 16 17 18
1
G
N
2
2
2
1
1
2
N
28 27 2625
24
23
22
21
20
19
12
1
V
2
2
C
SN54ABT8244 . . . JT PACKAGE
SN74ABT8244 . . . DW PACKAGE
(TOP VIEW)
SN54ABT8244 . . . FK PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
1OE
1Y1
1Y2
1Y3
1Y4
GND
2Y1
2Y2
2Y3
2Y4
TDO
TMS
2OE
1A1
1A2
1A3
1A4
2A1
V
CC
2A2
2A3
2A4
TDI
TCK
NC – No internal connection
SCOPE and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
P
相關(guān)PDF資料
PDF描述
SN54ABT828 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出))
SN74ABT828 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出))
SN54ABT834 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器)
SN74ABT834 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器)
SN54ABT8373 Scan Test Devices With Octal D-Type Latches(掃描測(cè)試裝置(帶八D鎖存器))
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABT8245DW 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8245DWE4 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8245DWG4 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8245DWR 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8245DWRE4 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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