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參數(shù)資料
| 型號： | SN54ABT8244 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測試設(shè)備與八路緩沖器（掃描測試裝置（帶八緩沖器）） |
| 文件頁數(shù)： | 15/19頁 |
| 文件大小： | 390K |
| 代理商： | SN54ABT8244 |
SN54ABT8244, SN74ABT8244
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS485 – JULY 1994
3–15
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 8. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(except I/O ports) (see Note 1)
Input voltage range, V
I
(I/O ports) (see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
Current into any output in the low state, I
O
: SN54ABT8244
–0.5 V to 7 V
–0.5 V to 7 V
–0.5 V to 5.5 V
–0.5 V to 5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . .
96 mA
128 mA
–18 mA
–50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ABT8244
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Storage temperature range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–65
°
C to 150
°
C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
recommended operating conditions (see Note 2)
SN54ABT8244
SN74ABT8244
UNIT
MIN
MAX
MIN
MAX
VCC
VIH
VIL
VI
IOH
IOL
t/
v
TA
NOTE 2: Unused or floating pins (input or I/O) must be held high or low.
Supply voltage
4.5
5.5
4.5
5.5
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
Input voltage
0
VCC
–24
0
VCC
–32
V
High-level output current
mA
Low-level output current
48
64
mA
Input transition rise or fall rate
10
10
ns/V
°
C
Operating free-air temperature
–55
125
–40
85
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT8244 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
| SN74ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
| SN54ABT834 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| SN74ABT834 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
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