- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄373435 > SN54ABTH182646A (Texas Instruments, Inc.) Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) PDF資料下載
參數(shù)資料
| 型號： | SN54ABTH182646A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) |
| 中文描述： | 掃描測試設備與18位通用總線收發(fā)器（掃描檢測裝置，帶18位收發(fā)器和寄存器） |
| 文件頁數(shù)： | 17/37頁 |
| 文件大?。?/td> | 842K |
| 代理商： | SN54ABTH182646A |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁當前第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A
SCAN TEST DEVICES WITH
18-BIT TRANSCEIVERS AND REGISTERS
SCBS166D – AUGUST 1993 – REVISED JULY 1996
17
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
pseudo-random pattern generation (PRPG)
A pseudo-random pattern is generated in the shift-register elements of the selected BSCs on each rising edge
of TCK, updated in the shadow latches, and applied to the associated device output-mode I/O pins on each
falling edge of TCK. Figures 6 and 7 illustrate the 36-bit linear-feedback shift-register algorithms through which
the patterns are generated. An initial seed value should be scanned into the BSR before performing this
operation. A seed value of all zeroes does not produce additional patterns.
=
1B8-I/O
1B7-I/O
1B6-I/O
1B5-I/O
1B4-I/O
1B3-I/O
1B2-I/O
1B1-I/O
1B9-I/O
1A7-I/O
1A6-I/O
1A5-I/O
1A4-I/O
1A3-I/O
1A2-I/O
1A1-I/O
1A8-I/O
1A9-I/O
2A7-I/O
2A6-I/O
2A5-I/O
2A4-I/O
2A3-I/O
2A2-I/O
2A1-I/O
2A8-I/O
2A9-I/O
2B8-I/O
2B7-I/O
2B6-I/O
2B5-I/O
2B4-I/O
2B3-I/O
2B2-I/O
2B1-I/O
2B9-I/O
Figure 6. 36-Bit PRPG Configuration (1OEA = 2OEA = 0, 1OEB = 2OEB = 1)
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
| SN74ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器) |
| SN54ABTH18652A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
| SN54ABTH245FK | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN74ABTH245DB | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH182646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
| SN54ABTH18502A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18502A_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
發(fā)布緊急采購，3分鐘左右您將得到回復。