- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄373435 > SN74ABT8244 (Texas Instruments, Inc.) Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) PDF資料下載
參數(shù)資料
| 型號： | SN74ABT8244 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測試設備與八路緩沖器（掃描測試裝置（帶八緩沖器）） |
| 文件頁數(shù)： | 11/19頁 |
| 文件大小： | 390K |
| 代理商： | SN74ABT8244 |
SN54ABT8244, SN74ABT8244
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS485 – JULY 1994
3–11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control-register opcode description
The BCR opcodes are decoded from BCR bits 2–0 as shown in Table 4. The selected test operation is
performed while the RUNT instruction is executed in the Run-Test/Idle state. The following descriptions detail
the operation of each BCR instruction and illustrate the associated PSA and PRPG algorithms.
Table 4. Boundary-Control-Register Opcodes
BINARY CODE
BIT 2
→
BIT 0
MSB
→
LSB
X00
X01
X10
011
111
DESCRIPTION
Sample inputs/toggle outputs (TOPSIP)
Pseudo-random pattern generation/16-bit mode (PRPG)
Parallel-signature analysis/16-bit mode (PSA)
Simultaneous PSA and PRPG/8-bit mode (PSA/PRPG)
Simultaneous PSA and binary count up/8-bit mode (PSA/COUNT)
It should be noted, in general, that while the control input BSCs (bits 17–16) are not included in the sample,
toggle, PSA, PRPG, or COUNT algorithms, the output-enable BSCs (bits 17–16 of the BSR) do control the drive
state (active or high impedance) of the selected device output pins.
PSA input masking
Bits 10–3 of the BCR specify device input pins to be masked from PSA operations. Bit 10 selects masking for
device input pin 2A4. Bit 3 selects masking for device input pin 1A1. Bits intermediate to 10 and 3 mask
corresponding device input pins in order from most significant to least significant, as indicated in Table 3. When
the mask bit which corresponds to a particular device input has a logic 1 value, the device input pin is masked
from any PSA operation, meaning that the state of the device input pin is ignored and has no effect on the
generated signature. Otherwise, when a mask bit has a logic 0 value, the corresponding device input is not
masked from the PSA operation.
sample inputs/toggle outputs (TOPSIP)
Data appearing at the device input pins is captured in the shift-register elements of the input BSCs on each rising
edge of TCK. This data is then updated in the shadow latches of the input BSCs and applied to the inputs of
the normal on-chip logic. Data in the shift-register elements of the output BSCs is toggled on each rising edge
of TCK, updated in the shadow latches, and applied to the device output pins on each falling edge of TCK.
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| SN74ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| SN54ABT834 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| SN74ABT834 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| SN54ABT8373 | Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT8245DW | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWE4 | 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWG4 | 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWRE4 | 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
發(fā)布緊急采購，3分鐘左右您將得到回復。