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參數(shù)資料
| 型號(hào)： | SN74ABT8244 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測(cè)試設(shè)備與八路緩沖器（掃描測(cè)試裝置（帶八緩沖器）） |
| 文件頁(yè)數(shù)： | 16/19頁(yè) |
| 文件大小： | 390K |
| 代理商： | SN74ABT8244 |
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SN54ABT8244, SN74ABT8244
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS485 – JULY 1994
3–16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Note 3)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT8244
MIN
SN74ABT8244
MIN
UNIT
MIN
MAX
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5.5 V,
VI = VCC or GND
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 0,
VCC = 5.5 V,
VCC = 5.5 V,
II = –18 mA
IOH = – 3 mA
IOH = – 3 mA
IOH = – 24 mA
IOH = – 32 mA
IOL = 48 mA
IOL = 64 mA
–1.2
–1.2
–1.2
V
VOH
2.5
2.5
2.5
V
3
3
3
2
2
2*
2
VOL
0.55
0.55
V
0.55*
0.55
II
A, OE, TCK
±
1
±
1
±
1
μ
A
IIH
IIL
IOZH
IOZL
Ioff
ICEX
IO
VI = VCC
VI = GND
VO = 2.7 V
VO = 0.5 V
VI or VO
≤
5.5 V
VO = 5.5 V
VO = 2.5 V
TDI, TMS
10
10
10
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
mA
TDI, TMS
–160
–160
–160
50
50
50
–50
±
100
50
–50
–50
±
100
50
Outputs high
50
–50
–100
–180
–50
–180
–50
–180
ICC
VCC = 5.5 V,
VI = VCC or GND
5 5 V
IO = 0,
Outputs high
2
2
2
Outputs low
30
30
30
mA
Outputs
disabled
2
2
2
VCC = 5.5 V,
VCC 5.5 V,
Other inputs at VCC or GND
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
One input at 3.4 V,
1 5
1.5
1 5
1.5
1 5
1.5
mA
ICC§
Ci
Co
3
pF
8
pF
* On products compliant to MIL-STD-883, Class B, this parameter does not apply.
All typical values are at VCC = 5 V.
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
§This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
NOTE 3: Product preview specifications are design goals only and are subject to change without notice.
P
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| SN74ABT8245DW | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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| SN74ABT8245DWG4 | 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWRE4 | 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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