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參數(shù)資料
| 型號： | SN74ABT8244 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測試設(shè)備與八路緩沖器（掃描測試裝置（帶八緩沖器）） |
| 文件頁數(shù)： | 3/19頁 |
| 文件大小： | 390K |
| 代理商： | SN74ABT8244 |
SN54ABT8244, SN74ABT8244
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS485 – JULY 1994
3–3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
GND
Ground
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS input directs the device through its
TAP controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
1A1–1A4,
2A1–2A4
Normal-function data inputs. See function table for normal-mode logic.
1OE, 2OE
Normal-function output-enable inputs. See function table for normal-mode logic.
1Y1–1Y4,
2Y1–2Y4
Normal-function data outputs. See function table for normal-mode logic.
P
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT8245DW | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWE4 | 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWG4 | 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8245DWRE4 | 功能描述:特定功能邏輯 Scan Test Device w/Octal Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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