參數(shù)資料
型號(hào)： TB1261F
廠商： Toshiba Corporation
英文描述： TOSHIBA BiCMOS INTEGRATED CIRCUIT, SILICON MONOLITHIC
中文描述： 東芝的BiCMOS集成電路，硅單片
文件頁(yè)數(shù)： 37/66頁(yè)
文件大小： 1544K
代理商： TB1261F
TB1261F/TB1262F
2002-6-30 37 / 66
SIF STAGE
Note
S1
Items/Symbols
SIF maximum input
signal / vin max(s)1
SIF minimum input
signal / vin min(s)1
SIF gain control
range / R AGC(s)1
2nd SIF output level
/ vSIF1
Bus conditions
RF AGC
:
except 0
PIF Freq. :
38.9MHz
Others : Preset
Measurement methods
(1) Input a 38.9[MHz], 90[dB( V)] signal at pin 79.
(2) Input a 33.4[MHz], 90[dB( V)] signal at pin 75.
(3) Measure the amplitude at pin 71 (vSIF1[dB( V)]).
(4) Decreasing the 33.4[MHz] signal level, measure the
33.4[MHz] signal level at which the amplitude at pin 3
turns to be –3[dB] against “vSIF1” (vin min(s)1[dB( V)]).
(5) Increasing the 33.4[MHz] signal level, measure the
33.4[MHz] signal level at which the amplitude at pin 3
turns to be +3[dB] against “vSIF1” (vin max(s)1[dB( V)]).
(6) R AGC[dB] = vin max1(s) – vin min1(s)
(1) Remove all connection from pin 75 and 76..
(2) Measure the resistance (Zin R(s)[k ]) and capacitance (Zin
C(s)[pF]) of pin 75 and 76 by the impedance meter.
SIF input resistance
/ Zin R(s)
SIF
capacitance
/ Zin C(s)
AM demodulation
sensitivity
/ vin minAM
AM demodulation
maximum input
level
/ vin maxAM
S2
input
Preset
S3
RF AGC:
except0
PIF Freq. :
38.9MHz
SIF Freq. :
6.5MHz
L-SECAM
MODE : 1
Others : Preset
(1) Input a 38.9[MHz], 90[dB( V)] signal at pin 79.
(2) Input a signal that 32.4[MHz], 80[dB( V)] and 54[%]
modulated by 400[Hz] sine wave at pin 75.
(3) Measure the amplitude at pin 71 (v#71[mVrms]).
(4) Decrease the 32.4[MHz] signal level, measure the
32.4[MHz] signal level at which the amplitude at pin 71
turns to be –3[dB] against “v#71” (vin minAM[dB( V)]).
(5) Increase the 32.4[MHz] signal level, measure the 32.4[MHz]
signal level at which the amplitude at pin 71 turns to be
–3[dB] against “v#71” (vin maxAM[dB( V)]).
(1) Input a 38.9[MHz], 90[dB( V)] signal at pin 79.
(2) Input a signal that 32.4[MHz], 80[dB( V)] and 54[%]
modulated by 400[Hz] sine wave at pin 75
(3) Measure the amplitude at pin 65 (vDet(s)AM[mVrms]).
(4) Measure the total harmonics distortion at pin 65
(THDAM[%]).
(5) Input a signal that 32.4[MHz], 80[dB(V)] at pin 75
(6) Measure the amplitude at pin 65 (vn(s)[mVrms]).
(7) S/N AM[dB] = 20log(vDet(s)/vn(s))
(1) Input a signal that 5.5[MHz], 100[dB( V)], 50[kHz] deviated
by 400[Hz] sine wave at pin 73.
(8) Measure the amplitude at pin 65 (vDet(s)5.5MH[mVrms]).
(9) Measure the total harmonics distortion at pin 65
(THD5.5MH[%]).
(2) Input a 5.5[MHz], 100[dB( V)] signal at pin 73.
(3) Measure the amplitude at pin 65 (vn(s)[mVrms]).
(4) (6)S/N4.5MH[dB] = 20log(vDet(s)/vn(s))
S4
AF output signal
amplitude
/ vDet(s)AM
AF output S/N
/ S/N(s)AM
Total harmonics
distortion
/ THDAM
SIF-Freq. : 6.5M
L SECAM
mode : L
SECAM
Others : Preset
S5
AF output signal
amplitude
/ vDet(s)5.5M
AF output S/N
/ S/N(s)5.5M
Total harmonics
distortion
/ THD5.5M
AF output signal
amplitude
/ vDet(s)6.0M
AF output S/N
/ S/N(s)6.0M
Total harmonics
distortion
/ THD6.0M
SIF-Freq. :5.5M
Others : Preset
S6
SIF-Freq. : 6.0M
AUDIO ATT :
127
Others : Preset
(1) Input a signal that 6.0[MHz], 100[dB( V)], 50[kHz] deviated
by 400[Hz] sine wave at pin 73.
(2) Do same measuring as vDet(s)5.5M et al. (vDet(s)6.0M,
S/N(s)6.5M, THD6.0M).
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