參數(shù)資料
型號(hào)： V53C364405A
廠商： Mosel Vitelic, Corp.
英文描述： 3.3 Volt 16M X 4 EDO Page Mode CMOS Dynamic RAM(3.3V 16Mx4 EDO頁(yè)面模式CMOS動(dòng)態(tài)RAM)
中文描述： 3.3伏特16米x 4 EDO公司頁(yè)面模式的CMOS動(dòng)態(tài)RAM（3.3 16Mx4 EDO公司頁(yè)面模式的CMOS動(dòng)態(tài)內(nèi)存）
文件頁(yè)數(shù)： 9/28頁(yè)
文件大?。?/td> 178K
代理商： V53C364405A
9
V53C364405A Rev. 1.2 June 1998
MOSEL V ITELIC
V53C364405A
Notes:
1)
All voltages are referenced to VSS.
V
IH
may overshoot to V
CC
+ 0.2V for pulse widths of < 4ns with 3.3V. V
IL
may undershoot to -2.0V for pulse width
< 4.0 ns with 3.3V. Pulse width measured at 50% points with amplitude measured peak to DC reference.
2)
I
CC1
, I
CC3
, I
CC4
and I
CC6
and I
CC7
depend on cycle rate.
3)
I
CC1
and I
CC4
depend on output loading. Specified values are measured with the output open.
4)
Address can be changed once or less while RAS = V
IL
. In the case of I
CC4
it can be changed once or less during a
EDO page mode cycle (t
PC
).
5)
An initial pause of 100
m
s is required after power-up followed by 8 RAS-only-refresh cycles, before proper device
operation is achieved. In case of using internal refresh counter, a minimum of 8 CAS-before-RAS initialization cy-
cles instead of 8 RAS cycles are required.
6)
AC measurements assume t
T
= 2 ns.
7)
V
IH (min.)
and V
IL (max.)
are reference levels for measuring timing of input signals. Also, transition times are measured
between V
IH
and V
IL
.
8)
Measured with the specified current load and 100 pF at V
OH
= 2.0 V and V
OL
= 0.8 V.
9)
Operation within the t
RCD (max.)
limit ensures that t
RAC (max.)
can be met. t
RCD (max.)
is specified as a reference point
only: If t
RCD
is greater than the specified t
RCD (max.)
limit, then access time is controlled by t
CAC
.
10)
Operation within the t
RAD (max.)
limit ensures that t
RAC (max.)
can be met. t
RAD (max.)
is specified as a reference point
only: If t
RAD
is greater than the specified t
RAD (max.)
limit, then access time is controlled by t
CAA
.
11) Either t
RCH
or t
RRH
must be satisfied for a read cycle.
12) t
OFF (max.)
and t
OEZ (max.)
define the time at which the outputs achieve the open-circuit condition and are not
referenced to output voltage levels.
13) Either t
DZC
or t
DZO
must be satisfied.
14) Either t
CDD
or t
ODD
must be satisfied.
15) t
WCS
, t
RWD
, t
CWD
, t
AWD
and t
CPWD
are not restrictive operating parameters. They are included in the data sheet as
electrical characteristics only. If t
WCS
> t
WCS
(min.), the cycle is an early write cycle and the I/O pin will remain open-
circuit (high impedance) through the entire cycle; if t
RWD
> t
RWD (min.)
, t
CWD
> t
CWD (min.)
, t
AWD
> t
AWD (min.)
and
t
CPWD
> t
CPWD (min.)
, the cycle is a read-write cycle and I/O pins will contain data read from the selected cells. If
neither of the above sets of conditions is satisfied, the condition of the I/O pins (at access time) is indeterminate.
16) These parameters are referenced to CAS leading edge in early write cycles and to WRITE leading edge in Read-
Modify-Write cycles.
17)
When using Self Refresh mode, the following refresh operations must be performed to ensure proper DRAM
operation:
If row addresses are being refresh in an evenly distributed manner over the refresh interval using CBR refresh
cycles, then only one CBR cycle must be performed immediatly after exit from Self Refresh.
If row addresses are being refresh in any other manner (ROR - Distributed/Burst or CBR-Burst) over the refresh
interval, then a full set of row refreshed must be performed immediately before entry to and immediatey after exit
from Self Refresh
18)
In a Test Mode Read Cycle, the value of trac, t
RAC
, t
CAC
and t
CPA
are delayed by 5 ns from the specified value.
These parameters must be adjusted in Test Mode cycles by adding 5ns to the specified value. Associated timings
must be adjusted by 5 ns.
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