參數(shù)資料
型號(hào): 72V293L6PFG
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: FIFO
英文描述: 64K X 18 OTHER FIFO, 4 ns, PQFP80
封裝: GREEN, PLASTIC, TQFP-80
文件頁(yè)數(shù): 21/45頁(yè)
文件大?。?/td> 381K
代理商: 72V293L6PFG
28
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72V223/233/243/253/263/273/283/293 3.3V HIGH DENSITY SUPERSYNC IITM NARROW BUS FIFO
512 x 18, 1K x 9/18, 2K x 9/18, 4K x 9/18, 8K x 9/18, 16K x 9/18, 32K x 9/18, 64K x 9/18, 128K x 9
FEBRUARY 11, 2009
Figure
10.
Read
Timing
(First
Word
Fall
Through
Mode)
WCLK
12
WEN
D
0
-
D
17
RCLK
tENS
REN
Q
0
-Q
17
PAF
HF
PAE
IR
OR
W
1
W
1
W
2
W
3
W
m+2
W
[m+3]
tOHZ
tSKEW1
tENH
tDS
tDH
tOE
tA
tPAFS
tWFF
tENS
OE
tSKEW2
W
D
4666
drw13
tPAES
W
[D-n]
W
[D-n-1]
tA
tHF
tREF
W
[D-1]
W
D
tA
W
[D-n+1]
W
[m+4]
W
[D-n+2]
(1)
(2)
tENS
D-1
]
[
W
D-1
]
[
W
12
NOTES:
1.
t
SKEW1
is
the
minimum
time
between
a
rising
RCLK
edge
and
a
rising
WCLK
edge
to
guarantee
that
IR
will
go
LOW
after
one
WCLK
cycle
plus
t
WFF
.If
the
time
between
the
rising
edge
of
RCLK
and
the
rising
edge
of
WCLK
is
less
than
t
SKEW1
,then
the
IR
assertion
may
be
delayed
one
extra
WCLK
cycle.
2.
tSKEW2
is
the
minimum
time
between
a
rising
RCLK
edge
and
a
rising
WCLK
edge
to
guarantee
that
PAF
will
go
HIGH
after
one
WCLK
cycle
plus
t
PAFS
.If
the
time
between
the
rising
edge
of
RCLK
and
the
rising
edge
of
WCLK
is
less
than
t
SKEW2
,then
the
PAF
deassertion
may
be
delayed
one
extra
WCLK
cycle.
3.
LD
=
HIGH
4
.
n=
PAE
Offset,
m
=
PAF
offset
and
D
=
maximum
FIFO
depth.
5
.
Ifx18
Input
or
x18
Output
bus
Width
is
selected,
D
=
513
for
the
IDT72V223,
1,025
for
the
IDT72V233,
2,049
for
the
IDT72V243
,4,097
for
the
IDT72V253,
8,193
for
the
IDT72V263,
16,385
for
the
IDT72V273,
32,769
for
the
IDT72V283
and
65,537
for
the
IDT72V293.
Ifboth
x9
Input
and
x9
Output
bus
Widths
are
selected,
D
=
1,025
for
the
IDT72V223,
2,049
for
the
IDT72V233,
4,097
for
the
IDT
72V243,
8,193
for
the
IDT72V253,
16,385
for
the
IDT72V263,
32,769
for
the
IDT72V273,
65,537
for
the
IDT72V283
and
131,073
for
the
IDT72V293.
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