參數(shù)資料
型號(hào): 80960JS
廠商: Intel Corp.
英文描述: High Performance 32-bit Embedded 3.3V Microprocessor(3.3V高性能32位嵌入式處理器)
中文描述: 高性能32位嵌入式微處理器3.3(3.3高性能32位嵌入式處理器)
文件頁數(shù): 21/86頁
文件大小: 1257K
代理商: 80960JS
80960JA/JF/JD/JS/JC/JT 3.3 V Microprocessor
Datasheet
21
HOLDA
O
R(Q)
H(1)
P(Q)
HOLD ACKNOWLEDGE
indicates to an external bus master that the processor has
relinquished control of the bus. The processor can grant HOLD requests and enter
the T
h
state during reset and while halted as well as during regular operation.
0 = hold not acknowledged
1 = hold acknowledged
BSTAT
O
R(0)
H(Q)
P(0)
BUS STATUS
indicates that the processor may soon stall unless it has sufficient
access to the bus; see
i960
Jx
Microprocessor User
s Guide
(272483). Arbitration
logic can examine this signal to determine when an external bus master should
acquire/relinquish the bus.
0 = no potential stall
1 = potential stall
Table 9. Pin Description
Processor Control Signals, Test Signals and Power (Sheet 1 of 2)
NAME
TYPE
DESCRIPTION
CLKIN
I
CLOCK
INPUT
provides the processor
s fundamental time base; both the processor
core and the external bus run at the CLKIN rate. All input and output timings are
specified relative to a rising CLKIN edge.
RESET#
I
A(L)
RESET
initializes the processor and clears its internal logic. During reset, the
processor places the address/data bus and control output pins in their idle (inactive)
states.
During reset, the input pins are ignored with the exception of LOCK#/ONCE#,
STEST and HOLD.
The RESET# pin has an internal synchronizer. To ensure predictable processor
initialization during power up, RESET# must be asserted a minimum of 10,000
CLKIN cycles with V
and CLKIN stable. On a warm reset, RESET# should be
asserted for a minimum of 15 cycles.
STEST
I
S(L)
SELF TEST
enables or disables the processor
s internal self-test feature at
initialization. STEST is examined at the end of reset. When STEST is asserted, the
processor performs its internal self-test and the external bus confidence test. When
STEST is deasserted, the processor performs only the external bus confidence test.
0 = self test disabled
1 = self test enabled
FAIL#
O
R(0)
H(Q)
P(1)
FAIL
indicates a failure of the processor
s built-in self-test performed during
initialization. FAIL# is asserted immediately upon reset and toggles during self-test to
indicate the status of individual tests:
When self-test passes, the processor deasserts FAIL# and begins operation
from user code.
When self-test fails, the processor asserts FAIL# and then stops executing.
0 = self test failed
1 = self test passed
TCK
I
TEST CLOCK
is a CPU input which provides the clocking function for IEEE 1149.1
Boundary Scan Testing (JTAG). State information and data are clocked into the
processor on the rising edge; data is clocked out of the processor on the falling edge.
TDI
I
S(L)
TEST DATA INPUT
is the serial input pin for JTAG. TDI is sampled on the rising
edge of TCK, during the SHIFT-IR and SHIFT-DR states of the Test Access Port.
Table 8. Pin Description
External Bus Signals (Sheet 4 of 4)
NAME
TYPE
DESCRIPTION
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