參數(shù)資料
型號(hào)： 9LRS4103BKLFT
廠商： INTEGRATED DEVICE TECHNOLOGY INC
元件分類： 微控制器/微處理器
英文描述： SPECIALTY MICROPROCESSOR CIRCUIT, PQCC32
封裝： ROHS COMPLIANT, PLASTIC, MLF-32
文件頁(yè)數(shù)： 7/15頁(yè)
文件大?。?/td> 188K
代理商： 9LRS4103BKLFT
ICS9LRS4103
PC MAIN CLOCK
15
Innovate with IDT and accelerate your future networks. Contact:
www.IDT.com
For Sales
800-345-7015
408-284-8200
Fax: 408-284-2775
For Tech Support
408-284-6578
pcclockhelp@idt.com
Corporate Headquarters
Integrated Device Technology, Inc.
6024 Silver Creek Valley Road
San Jose, CA 95138
United States
800 345 7015
+408 284 8200 (outside U.S.)
Asia Pacific and Japan
IDT Singapore Pte. Ltd.
1 Kallang Sector #07-01/06
KolamAyer Industrial Park
Singapore 349276
Phone: 65-6-744-3356
Fax: 65-6-744-1764
Europe
IDT Europe Limited
321 Kingston Road
Leatherhead, Surrey
KT22 7TU
England
Phone: 44-1372-363339
Fax: 44-1372-378851
2010 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, ICS, and the IDT logo are trademarks
of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks
are or may be trademarks or registered trademarks used to identify products or services of their respective owners.
Printed in USA
This product is protected by United States Patent NO. 7,342,420 and other patents.
Revision History
Rev.
Issue Date WHO Description
Page #
A
03/15/10
RDW
1. Updated electrical characteristics per char data
2. Added Table 4: Series Resistor values for REF
3. Corrected SMBus reference to REF strength. REF is 1 load/2load strength.
4. Release to final
Various
B
04/08/10
RDW Update part ordering to "B" rev.
C
12/09/10
RDW Removed "Tubes" from ordering info; replaced with "Tray".
D
01/06/11
RDW
1. Added test loads.
2. Updated electrical tables to include typical values and improved SRC cycle to cycle
jitter spec from 125ps to 85ps.
3. Added phase jitter table for PCIe Gen2.
4. Revised text on front page
5. Corrected typographical errors.
Various
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