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| 型號： | AD9637-80EBZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 18/40頁 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD9637 |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | * |
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Data Sheet
AD9637
Rev. A | Page 25 of 40
Two output clocks are provided to assist in capturing data from
the AD9637. The DCO is used to clock the output data and is
equal to 6× the sample clock (CLK) rate for the default mode of
opera-tion. Data is clocked out of the AD9637 and must be
captured on the rising and falling edges of the DCO that supports
double data rate (DDR) capturing. The FCO is used to signal the
start of a new output byte and is equal to the sample clock rate
(see the Timing Diagrams section).
When the SPI is used, the DCO phase can be adjusted in 60°
increments relative to the data edge. This enables the user to
refine system timing margins, if required. The default DCO+
and DCO timing, as shown in Figure 2, is 180° relative to the
output data edge.
A 10-bit serial stream can also be initiated from the SPI. This
allows the user to implement and test compatibility to lower
resolution systems. When changing the resolution to a 10-bit
serial stream, the data stream is shortened. See Figure 3 for the
10-bit example.
In default mode, as shown in Figure 2, the MSB is first in the data
output serial stream. This can be inverted so that the LSB is first
in the data output serial stream by using the SPI.
There are 12 digital output test pattern options available that can
be initiated through the SPI. This is a useful feature when validating
receiver capture and timing (see Table 11 for the output bit
sequencing options that are available). Some test patterns have
two serial sequential words and can be alternated in various ways,
depending on the test pattern chosen. Note that some patterns
do not adhere to the data format select option. In addition,
custom user-defined test patterns can be assigned in the 0x19,
0x1A, 0x1B, and 0x1C register addresses.
Table 11. Flexible Output Test Modes
OutputTest
Mode Bit
Sequence
Pattern Name
Digital Output Word 1
Digital Output Word 2
Subject
to Data
Format
Select
Notes
0000
Off (default)
N/A
0001
Midscale short
1000 0000 0000 (12-bit)
N/A
Yes
Offset binary code shown
10 0000 0000 (10-bit)
N/A
Yes
Offset binary code shown
0010
+Full-scale short
1111 1111 1111 (12-bit)
N/A
Yes
Offset binary code shown
11 1111 1111 (10-bit)
N/A
Yes
Offset binary code shown
0011
Full-scale short
0000 0000 0000 (12-bit)
N/A
Yes
Offset binary code shown
00 0000 0000 (10-bit)
N/A
Yes
Offset binary code shown
0100
Checkerboard
1010 1010 1010 (12-bit)
0101 0101 0101 (12-bit)
No
10 1010 1010 (10-bit)
01 0101 0101 (10-bit)
No
0101
PN sequence long1
N/A
Yes
PN23
ITU 0.150
X23 + X18 + 1
0110
PN sequence short1
N/A
Yes
PN9
ITU O.150
X9 + X5 + 1
0111
One-/zero-word toggle
1111 1111 1111 (12-bit)
0000 0000 0000 (12-bit)
No
11 1111 1111 (10-bit)
00 0000 0000 (10-bit)
No
1000
User input
Reg. 0x19 to Reg. 0x1A
Reg. 0x1B to Reg. 0x1C
No
1001
1-/0-bit toggle
1010 1010 1010 (12-bit)
N/A
No
10 1010 1010 (10-bit)
N/A
No
1010
1× sync
0000 0011 1111 (12-bit)
N/A
No
00 0001 1111 (10-bit)
N/A
No
1011
One bit high
1000 0000 0000 (12-bit)
N/A
No
Pattern associated with
the external pin
10 0000 0000 (10-bit)
N/A
No
Pattern associated with
the external pin
1100
Mixed frequency
1010 0011 0011 (12-bit)
N/A
No
10 0110 0011 (10-bit)
N/A
No
1
All test mode options except PN sequence short and PN sequence long can support 10-bit to 12-bit word lengths to verify data capture to the receiver.
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