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| 型號(hào)： | DS21FF44 |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 102/117頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC FRAMER E1 4X4 16CH 300-BGA |
| 產(chǎn)品培訓(xùn)模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標(biāo)準(zhǔn)包裝： | 40 |
| 控制器類型： | E1 調(diào)幀器 |
| 接口： | 并行/串行 |
| 電源電壓： | 2.97 V ~ 3.63 V |
| 電流 - 電源： | 300mA |
| 工作溫度： | 0°C ~ 70°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 300-BBGA |
| 供應(yīng)商設(shè)備封裝： | 300-PBGA（27x27） |
| 包裝： | 管件 |
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DS21FT44/DS21FF44
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21.2. TAP CONTROLLER STATE MACHINE
This section covers the details on the operation of the Test Access Port (TAP) Controller State Machine.
Please see Figure 21.2 for details on each of the states described below.
TAP Controller
The TAP controller is a finite state machine that responds to the logic level at JTMS on the rising edge of
JTCLK.
Test-Logic-Reset
Upon power-up of the DS21Q44, the TAP Controller will be in the Test-Logic-Reset state. The
Instruction register will contain the IDCODE instruction. All system logic of the DS21Q44 will operate
normally.
Run-Test-Idle
The Run-Test-Idle is used between scan operations or during specific tests. The Instruction register and
Test registers will remain idle.
Select-DR-Scan
All test registers retain their previous state. With JTMS low, a rising edge of JTCLK moves the
controller into the Capture-DR state and will initiate a scan sequence. JTMS HIGH during a rising edge
on JTCLK moves the controller to the Select-IR
Capture-DR
Data may be parallel-loaded into the Test Data registers selected by the current instruction. If the
instruction does not call for a parallel load or the selected register does not allow parallel loads, the Test
register will remain at its current value. On the rising edge of JTCLK, the controller will go to the Shift-
DR state if JTMS is low or it will go to the Exit1-DR state if JTMS is high.
Shift-DR
The Test Data register selected by the current instruction will be connected between JTDI and JTDO and
will shift data one stage towards its serial output on each rising edge of JTCLK. If a Test Register
selected by the current instruction is not placed in the serial path, it will maintain its previous state.
Exit1-DR
While in this state, a rising edge on JTCLK with JTMS high will put the controller in the Update-DR
state, and terminate the scanning process. A rising edge on JTCLK with JTMS low will put the controller
in the Pause-DR state.
Pause-DR
Shifting of the test registers is halted while in this state. All Test registers selected by the current
instruction will retain their previous state. The controller will remain in this state while JTMS is low. A
rising edge on JTCLK with JTMS high will put the controller in the Exit2-DR state.
Exit2-DR
While in this state, a rising edge on JTCLK with JTMS high will put the controller in the Update-DR
state and terminate the scanning process. A rising edge on JTCLK with JTMS low will enter the Shift-
DR state.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| DS21FF44N | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS21FT40 | 制造商:DALLAS 制造商全稱:Dallas Semiconductor 功能描述:Four x Three 12 Channel E1 Framer |
| DS21FT40N | 制造商:Rochester Electronics LLC 功能描述: 制造商:Maxim Integrated Products 功能描述: |
| DS21FT42 | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 4x4 16/4x3 12 Chnl T1/T1 Framer RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS21FT42N | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 4x4 16/4x3 12 Chnl T1/T1 Framer RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
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