參數(shù)資料
型號： DSPB56371AF150
廠商： Freescale Semiconductor
文件頁數(shù)： 27/68頁
文件大小： 0K
描述： IC DSP 24BIT 150MHZ 80-LQFP
標(biāo)準(zhǔn)包裝： 90
系列： DSP56K/Symphony
類型： 音頻處理器
接口： 主機接口，I²C，SAI，SPI
時鐘速率： 150MHz
非易失內(nèi)存： ROM（384 kB）
芯片上RAM： 264kB
電壓 - 輸入/輸出： 3.30V
電壓 - 核心： 1.25V
工作溫度： -40°C ~ 115°C
安裝類型： 表面貼裝
封裝/外殼： 80-LQFP
供應(yīng)商設(shè)備封裝： 80-LQFP（14x14）
包裝： 托盤
Maximum Ratings
DSP56371 Data Sheet, Rev. 4.1
Freescale Semiconductor
33
3.13 JTAG/OnCE Interface
4
Maximum Ratings
CAUTION
This device contains circuitry protecting against damage due to high static voltage or
electrical fields. However, normal precautions should be taken to avoid exceeding
maximum voltage ratings. Reliability of operation is enhanced if unused inputs are pulled
to an appropriate logic voltage level (for example, either GND or VDD). The suggested
value for a pull-up or pull-down resistor is 4.7 k
.
NOTE
In the calculation of timing requirements, adding a maximum value of one specification to
a minimum value of another specification does not yield a reasonable sum. A maximum
specification is calculated using a worst case variation of process parameter values in one
direction. The minimum specification is calculated using the worst case for the same
parameters in the opposite direction. Therefore, a “maximum” value for a specification will
never occur in the same device that has a “minimum” value for another specification;
adding a maximum to a minimum represents a condition that can never exist.
Table 13. JTAG/OnCE Interface
Signal
Name
Signal
Type
State
during
Reset
Signal Description
TCK
Input
Test Clock—TCK is a test clock input signal used to synchronize the JTAG
test logic. It has an internal pull-up resistor.
Internal Pull up resistor.
This input is 5 V tolerant.
TDI
Input
Test Data Input—TDI is a test data serial input signal used for test instructions
and data. TDI is sampled on the rising edge of TCK and has an internal pull-up
resistor.
Internal Pull up resistor.
This input is 5 V tolerant.
TDO
Output
Tri-state
Test Data Output—TDO is a test data serial output signal used for test
instructions and data. TDO is tri-statable and is actively driven in the shift-IR
and shift-DR controller states. TDO changes on the falling edge of TCK.
TMS
Input
Test Mode Select—TMS is an input signal used to sequence the test
controller’s state machine. TMS is sampled on the rising edge of TCK and has
an internal pull-up resistor.
Internal Pull up resistor.
This input is 5 V tolerant.
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