參數(shù)資料
型號: FW80200M733
英文描述: Microprocessor
中文描述: 微處理器
文件頁數(shù): 16/36頁
文件大?。?/td> 461K
代理商: FW80200M733
Intel
80200 Processor based on Intel
XScale
Microarchitecture
Package Information
16
August 2002
Datasheet
Table 5.
JTAG Pins
Name
Count
Type
Description
TCK
1
I
TEST CLOCK
is an input which provides the clocking function for
the IEEE 1149.1 Boundary Scan Testing (JTAG). State information
and data are clocked into the component on the rising edge and
data is clocked out of the component on the falling edge.
TDI
1
I
TEST DATA INPUT
is the serial input pin for the JTAG feature. TDI
is sampled on the rising edge of
TCK
, during the SHIFT-IR and
SHIFT-DR states of the Test Access Port. This signal has a weak
internal pullup to ensure proper operation when this signal is
unconnected.
TDO
1
O
TEST DATA OUTPUT
is the serial output pin for the JTAG feature.
TDO
is driven on the falling edge of
TCK
during the SHIFT-IR and
SHIFT-DR states of the Test Access Port. At other times,
TDO
floats.
TRST#
1
I
TEST RESET
asynchronously resets the Test Access Port (TAP)
controller function of IEEE 1149.1 Boundary Scan Testing (JTAG).
This signal has a weak internal pullup to ensure proper operation
when this signal is unconnected.
TRST#
must be driven low during processor reset to ensure proper
operation. Additionally, before performing JTAG test, the processor
should be reset and should have a valid clock at
CLK
to ensure it
does not enter a low-power mode.
TMS
1
I
TEST MODE SELECT
is sampled at the rising edge of
TCK
to
select the operation of the test logic for IEEE 1149.1 Boundary
Scan testing. This signal has a weak internal pullup to ensure
proper operation when this signal is unconnected.
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