參數(shù)資料
型號: HYB 514100BJ-50
廠商: SIEMENS AG
英文描述: 4M × 1-Bit Dynamic RAM(4M × 1位動(dòng)態(tài)RAM)
中文描述: 4米× 1位動(dòng)態(tài)隨機(jī)存儲(chǔ)器(4米× 1位動(dòng)態(tài)內(nèi)存)
文件頁數(shù): 20/21頁
文件大小: 108K
代理商: HYB 514100BJ-50
HYB 514100BJ-50/-60
4M
×
1 DRAM
Semiconductor Group
20
1998-10-01
Test Mode Entry
Test Mode
The HYB 514100BJ is organized 4 194 304 words by 1-bit but can internally be configured as
524 288 words by 8-bits. A WE, CAS-before-RAS cycle puts the device into Test Mode.
In Test Mode, data is written into 8 sectors in parallel and retrieved the same way. If, upon reading,
all bits are equal, the data output pin indicates a “1”. If any of the bits differ, the data output pin
indicates a “0”. In Test Mode the 4M DRAM can be tested as if it were a 512K DRAM. Test Mode
is exited by any refresh operation which is not a WE, CAS-before-RAS cycle. Addresses A10R,
A10C and A0C do not care during Test Mode.
SPT03024
"H" or "L"
A0 A10
-
OH
OL
IH
IL
IL
DO
(Output)
V
WE
V
V
V
V
OFF
t
WTS
t
WTH
t
IH
IH
IL
IL
IH
CAS
V
V
V
RAS
V
V
RP
RPG
t
t
CP
t
CSR
t
CHR
t
Row
Address
Z
Hi
CRP
t
RAS
RC
t
RPC
t
ASR
t
t
t
RP
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相關(guān)代理商/技術(shù)參數(shù)
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