參數(shù)資料
型號: HYB314100BJL-60
廠商: SIEMENS A G
元件分類: DRAM
英文描述: 4M x 1-Bit Dynamic RAM Low Power 4M x 1-Bit Dynamic RAM
中文描述: 4M X 1 FAST PAGE DRAM, 60 ns, PDSO20
封裝: 0.300 INCH, PLASTIC, SOJ-20
文件頁數(shù): 22/23頁
文件大?。?/td> 1153K
代理商: HYB314100BJL-60
Semiconductor Group
22
HYB 314100BJ/BJL-50/-60/-70
3.3V 4M x 1 DRAM
Test Mode Entry
Test Mode
The HYB314100BJ/BJL is organized 4 194 304 words by 1- bit but can internally be configured as
524 288 words by 8-bits. A WE, CAS-before-RAS cycle puts the device into Test Mode.
In Test Mode, data is written into 8 sectors in parallel and retrieved the same way. If, upon reading,
all bits are equal, the data output pin indicates a “1”. If any of the bits differ, the data output pin
indicates a “0”. In Test Mode the 4M DRAM can be tested as if it were a 512K DRAM. Test Mode
is exited by any refresh operation which is not a WE, CAS- before-RAS cycle. Addresses A10R,
A10C and A0C do not care during Test Mode.
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相關代理商/技術參數(shù)
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HYB314100BJL-70 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:4M x 1-Bit Dynamic RAM Low Power 4M x 1-Bit Dynamic RAM
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HYB314171BJ-50- 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:3.3V 256 K x 16-Bit Dynamic RAM 3.3V Low Power 256 K x 16-Bit Dynamic RAM with Self Refresh
HYB314171BJ-60 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:3.3V 256 K x 16-Bit Dynamic RAM 3.3V Low Power 256 K x 16-Bit Dynamic RAM with Self Refresh
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