參數(shù)資料
型號: SCM69C233
廠商: Motorola, Inc.
英文描述: 4K x 64 Content Addressable Memory(4K x 64內(nèi)容可尋址存儲器)
中文描述: 4K的× 64內(nèi)容可尋址存儲器(4K的× 64內(nèi)容可尋址存儲器)
文件頁數(shù): 16/22頁
文件大小: 167K
代理商: SCM69C233
MCM69C233
SCM69C233
16
MOTOROLA FAST SRAM
JTAG
AC OPERATING CONDITIONS AND CHARACTERISTICS
FOR THE TEST ACCESS PORT (IEEE 1149.1)
(TJ < 120
°
C, Unless Otherwise Noted)
Input Timing Measurement Reference Level
Input Pulse Levels
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . .
0 to 3.0 V
3 ns
Output Measurement Timing Level
Output Load
. . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . . . . . . . . . .
50
Termination to 1.5 V
TAP CONTROLLER TIMING
Parameter
Symbol
Min
Max
Unit
Notes
Cycle Time
tCK
tCKH
tCKL
tA
tCKZ
tCKX
tS
tSD
tSR
30
ns
Clock High Time
12
ns
Clock Low Time
12
ns
Clock Low to Output Valid
5
9
ns
Clock Low to Output High–Z
0
9
ns
1
Clock Low to Output Active
0
9
ns
2, 3
Setup Times:
TMS
TDI
TRST
2
2
2
ns
Hold Times:
TMS
TDI
TRST
tH
tHD
tHR
2
2
10
ns
NOTES:
1. TDO will High–Z from a clock low edge depending on the current state of the TAP state machine.
2. TDO is active only in the SHIFT–IR and SHIFT–DR state of the TAP state machine.
3. Transition is measured
±
500 mV from steady–state voltage. This parameter is sampled and not 100% tested.
tCK
tH
tCKX
tSD
tS
tHD
tA
tCKZ
tCKH
tCKL
Figure 4. TAP Controller Timing
tSR
tHR
TRST
TEST CLOCK
(TCK)
TEST MODE SELECT
(TMS)
TEST DATA IN
(TDI)
TEST DATA OUT
(TDO)
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