參數(shù)資料
型號: SKW07N120
廠商: INFINEON TECHNOLOGIES AG
英文描述: Fast IGBT in NPT-technology with soft, fast recovery anti-parallel EmCon diode
中文描述: 快速IGBT在不擴散核武器條約與軟,恢復(fù)快反平行快恢復(fù)二極管技術(shù)
文件頁數(shù): 9/13頁
文件大小: 413K
代理商: SKW07N120
SKW07N120
Power Semiconductors
9
Jul-02
t
r
,
R
200A/
μ
s
400A/
μ
s
600A/
μ
s
800A/
μ
s
0ns
50ns
100ns
150ns
200ns
250ns
300ns
350ns
I
F
=3.5A
I
F
=7A
Q
r
,
R
200A/
μ
s
400A/
μ
s
600A/
μ
s
800A/
μ
s
0.00μC
0.25μC
0.50μC
0.75μC
1.00μC
1.25μC
1.50μC
I
F
=3.5A
I
F
=7A
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 21. Typical reverse recovery time as
a function of diode current slope
(
V
R
= 800V,
T
j
= 150
°
C,
dynamic test circuit in Fig.E )
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 22. Typical reverse recovery charge
as a function of diode current slope
(
V
R
= 800V,
T
j
= 150
°
C,
dynamic test circuit in Fig.E )
I
r
,
R
200A/
μ
s
400A/
μ
s
600A/
μ
s
800A/
μ
s
0A
5A
10A
15A
20A
25A
I
F
=3.5A
I
F
=7A
d
r
/
,
D
O
200A/
μ
s
400A/
μ
s
600A/
μ
s
800A/
μ
s
0A/
μ
s
100A/
μ
s
200A/
μ
s
300A/
μ
s
I
F
=3.5A
I
F
=7A
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery current
as a function of diode current slope
(
V
R
= 800V,
T
j
= 150
°
C,
dynamic test circuit in Fig.E )
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 24. Typical diode peak rate of fall of
reverse recovery current as a function of
diode current slope
(
V
R
= 800V,
T
j
= 150
°
C,
dynamic test circuit in Fig.E )
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