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參數(shù)資料
| 型號(hào)： | SN54ABT8240 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測(cè)試設(shè)備與八路緩沖器（掃描測(cè)試裝置（帶八緩沖器）） |
| 文件頁數(shù)： | 10/19頁 |
| 文件大?。?/td> | 391K |
| 代理商： | SN54ABT8240 |
SN54ABT8240, SN74ABT8240
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS484 – JULY 1994
3–10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
control boundary to high impedance
This instruction conforms to the IEEE Standard 1149.1a-1993 HIGHZ instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in a modified test mode in which all device I/O pins are placed in the high-impedance state, the device
input pins remain operational, and the normal on-chip logic function is performed.
control boundary to 1/0
This instruction conforms to the IEEE Standard 1149.1a-1993 CLAMP instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the input
BSCs is applied to the inputs of the normal on-chip logic, while data in the output BSCs is applied to the device
output pins. The device operates in the test mode.
boundary run test
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during
Run-Test/Idle. The five test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP),
PRPG, PSA, simultaneous PSA and PRPG (PSA/PRPG), and simultaneous PSA and binary count up
(PSA/COUNT).
boundary read
The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This
instruction is useful for inspecting data after a PSA operation.
boundary self test
The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR.
In this way, the contents of the shadow latches can be read out to verify the integrity of both shift register and
shadow latch elements of the BSR. The device operates in the normal mode.
boundary toggle outputs
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. Data in the shift-register elements of the output BSCs is toggled on each rising edge of TCK in
Run-Test/Idle, updated in the shadow latches, and applied to the device output pins on each falling edge of TCK
in Run-Test/Idle. Data in the input BSCs remains constant and is applied to the inputs of the normal on-chip logic.
Data appearing at the device input pins is not captured in the input BSCs. The device operates in the test mode.
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a boundary run test operation to specify which test operation is to be
executed.
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相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT8240 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN54ABT8244 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN74ABT8244 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
| SN74ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
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