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參數(shù)資料
| 型號： | SN54ABT8240 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測試設(shè)備與八路緩沖器（掃描測試裝置（帶八緩沖器）） |
| 文件頁數(shù)： | 2/19頁 |
| 文件大?。?/td> | 391K |
| 代理商： | SN54ABT8240 |
SN54ABT8240, SN74ABT8240
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS484 – JULY 1994
3–2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
FUNCTION TABLE
(normal mode)
INPUTS
OUTPUT
Y
OE
H
A
X
Z
L
L
H
L
H
L
functional block diagram
Boundary-Control
Register
Bypass Register
Boundary-Scan Register
Instruction Register
TDI
TMS
TCK
TDO
TAP
Controller
VCC
VCC
One of Four Channels
14
12
13
11
2A1
2Y1
19
7
24
2OE
One of Four Channels
1A1
1Y1
23
2
1
1OE
Pin numbers shown are for the DW and JT packages.
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT8240 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| SN54ABT8244 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| SN74ABT8244 | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| SN74ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
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