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參數(shù)資料
| 型號(hào)： | SN54ABT8240 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| 中文描述： | 掃描測(cè)試設(shè)備與八路緩沖器（掃描測(cè)試裝置（帶八緩沖器）） |
| 文件頁(yè)數(shù)： | 17/19頁(yè) |
| 文件大?。?/td> | 391K |
| 代理商： | SN54ABT8240 |
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SN54ABT8240, SN74ABT8240
SCAN TEST DEVICES WITH OCTAL BUFFERS
SCBS484 – JULY 1994
3–17
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Note 3 and Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
SN54ABT8240
SN74ABT8240
UNIT
TYP
MAX
MIN
MAX
MIN
MAX
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
A
Y
2
6
ns
2
6
OE
Y
2
8
ns
2
8
OE
Y
2
2
8
8
ns
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Note 3 and Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
50
SN54ABT8240
SN74ABT8240
UNIT
TYP
90
MAX
MIN
50
MAX
MIN
50
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
TCK
MHz
TCK
↓
Y
2
12
ns
2
12
TCK
↓
TDO
2
7
ns
2
7
TCK
↓
Y
2
13
ns
2
13
TCK
↓
TDO
2
7
ns
2
7
TCK
↓
Y
2
14
ns
2
14
TCK
↓
TDO
2
2
9
9
ns
NOTE 3: Product preview specifications are design goals only and are subject to change without notice.
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT8240 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN54ABT8244 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN74ABT8244 | Scan Test Devices With Octal Buffers(掃描測(cè)試裝置(帶八緩沖器)) |
| SN54ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
| SN74ABT828 | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT8245FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
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