參數(shù)資料
型號(hào)： SN54ABTH18504A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測(cè)裝置，帶20位通用總線(xiàn)收發(fā)器)
中文描述： 掃描測(cè)試設(shè)備與20位通用總線(xiàn)收發(fā)器（掃描檢測(cè)裝置，帶20位通用總線(xiàn)收發(fā)器）
文件頁(yè)數(shù)： 14/35頁(yè)
文件大?。?/td> 812K
代理商： SN54ABTH18504A
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
14
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
bypass scan
This instruction conforms to the IEEE Standard 1149.1-1990 BYPASS instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in the normal mode.
control boundary to high impedance
This instruction conforms to the IEEE Standard 1149.1a-1993 HIGHZ instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in a modified test mode in which all device I/O pins are placed in the high-impedance state, the device
input pins remain operational, and the normal on-chip logic function is performed.
control boundary to 1/0
This instruction conforms to the IEEE Standard 1149.1a-1993 CLAMP instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the I/O
BSCs for pins in the output mode is applied to the device I/O pins. The device operates in the test mode.
boundary-run test
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during
Run-Test/Idle. The five test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP),
PRPG, PSA, simultaneous PSA and PRPG (PSA/PRPG), and simultaneous PSA and binary count up
(PSA/COUNT).
boundary read
The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This
instruction is useful for inspecting data after a PSA operation.
boundary self test
The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR.
In this way, the contents of the shadow latches can be read out to verify the integrity of both shift-register and
shadow-latch elements of the BSR. The device operates in the normal mode.
boundary toggle outputs
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. Data in the shift-register elements of the selected output-mode BSCs is toggled on each rising
edge of TCK in Run-Test/Idle, updated in the shadow latches, and applied to the associated device I/O pins on
each falling edge of TCK in Run-Test/Idle. Data in the input-mode BSCs remains constant. Data appearing at
the device input or I/O pins is not captured in the input-mode BSCs. The device operates in the test mode.
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a RUNT operation to specify which test operation is to be executed.
相關(guān)PDF資料
PDF描述
SN54ABTH182646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH182646A Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測(cè)裝置，帶18位收發(fā)器和寄存器)
SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置，帶18位總線(xiàn)收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測(cè)裝置帶18位總線(xiàn)收發(fā)器和寄存器)
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABTH18504A_08 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18504AHV 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18646A 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18652A 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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