參數(shù)資料
型號(hào)： SN54ABTH18504A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測(cè)裝置，帶20位通用總線收發(fā)器)
中文描述： 掃描測(cè)試設(shè)備與20位通用總線收發(fā)器（掃描檢測(cè)裝置，帶20位通用總線收發(fā)器）
文件頁(yè)數(shù)： 2/35頁(yè)
文件大小： 812K
代理商： SN54ABTH18504A
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
18 19
48
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63 62 61 60 59
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A
G
L
T
A
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A4
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GND
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CC
A11
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GND
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GND
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V
CC
B11
B12
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GND
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B17
C
SN74ABTH18504A, SN74ABTH182504A . . . PM PACKAGE
(TOP VIEW)
description
The ’ABTH18504A and ’ABTH182504A scan test devices with 20-bit universal bus transceivers are members
of the Texas Instruments SCOPE
testability integrated-circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to
the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type
flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the
TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the
boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the
SCOPE
universal bus transceivers.
Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA),
clock-enable (CLKENAB and CLKENBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the
device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while
CLKENAB is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and
CLKENAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB is low, the B outputs
are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to
A-to-B data flow, but uses the OEBA, LEBA, CLKENBA, and CLKBA inputs.
In the test mode, the normal operation of the SCOPE
universal bus transceivers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
相關(guān)PDF資料
PDF描述
SN54ABTH182646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH182646A Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測(cè)裝置，帶18位收發(fā)器和寄存器)
SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置，帶18位總線收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測(cè)裝置帶18位總線收發(fā)器和寄存器)
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABTH18504A_08 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18504AHV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18646A 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18652A 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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