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參數(shù)資料
| 型號： | SN54ABTH18504A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| 中文描述： | 掃描測試設(shè)備與20位通用總線收發(fā)器（掃描檢測裝置，帶20位通用總線收發(fā)器） |
| 文件頁數(shù)： | 5/35頁 |
| 文件大?。?/td> | 812K |
| 代理商： | SN54ABTH18504A |
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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
A1–A20
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B20
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
CLKENAB, CLKENBA
Normal-function clock enables. See function table for normal-mode logic.
GND
Ground
LEAB, LEBA
Normal-function latch enables. See function table for normal-mode logic.
OEAB, OEBA
Normal-function output enables. See function table for normal-mode logic. An internal pullup at each terminal
forces the terminal to a high level if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are
synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting
data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left
unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting
data through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through
its TAP controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
相關(guān)PDF資料 |
PDF描述 |
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| SN54ABTH182646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646A | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) |
| SN54ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
| SN74ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH18504A_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18504AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18646A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18652A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
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