參數(shù)資料
型號(hào)： SN54ABTH18504A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測(cè)裝置，帶20位通用總線收發(fā)器)
中文描述： 掃描測(cè)試設(shè)備與20位通用總線收發(fā)器（掃描檢測(cè)裝置，帶20位通用總線收發(fā)器）
文件頁(yè)數(shù)： 18/35頁(yè)
文件大?。?/td> 812K
代理商： SN54ABTH18504A
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
parallel-signature analysis (PSA)
Data appearing at the selected device input-mode I/O pins is compressed into a 40-bit parallel signature in the
shift-register elements of the selected BSCs on each rising edge of TCK. Data in the shadow latches of the
selected output-mode BSCs remains constant and is applied to the associated device I/O pins. Figures 7 and 8
show the 40-bit linear-feedback shift-register algorithms through which the signature is generated. An initial
seed value should be scanned into the BSR before performing this operation.
B8-I/O
B7-I/O
B6-I/O
B5-I/O
B4-I/O
B3-I/O
B2-I/O
B1-I/O
B10-I/O
A7-I/O
A6-I/O
A5-I/O
A4-I/O
A3-I/O
A2-I/O
A1-I/O
A8-I/O
A10-I/O
A17-I/O
A16-I/O
A15-I/O
A14-I/O
A13-I/O
A12-I/O
A11-I/O
A18-I/O
A20-I/O
B18-I/O
B17-I/O
B16-I/O
B15-I/O
B14-I/O
B13-I/O
B12-I/O
B11-I/O
B20-I/O
B9-I/O
A9-I/O
A19-I/O
B19-I/O
=
=
Figure 7. 40-Bit PSA Configuration (OEAB = 0, OEBA = 1)
相關(guān)PDF資料
PDF描述
SN54ABTH182646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH182646A Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測(cè)裝置，帶18位收發(fā)器和寄存器)
SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置，帶18位總線收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測(cè)裝置帶18位總線收發(fā)器和寄存器)
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABTH18504A_08 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18504AHV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18646A 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18646AHV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH18652A 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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