參數(shù)資料
型號: HY27USxxx
廠商: Hynix Semiconductor Inc.
英文描述: 512Mbit (64Mx8bit / 32Mx16bit) NAND Flash
中文描述: 512兆(64Mx8bit / 32Mx16bit)NAND閃存
文件頁數(shù): 30/43頁
文件大小: 729K
代理商: HY27USXXX
Rev 0.6 / Oct. 2004
30
HY27SS(08/16)121M Series
HY27US(08/16)121M Series
512Mbit (64Mx8bit / 32Mx16bit) NAND Flash
Note: (1). The time to Ready depends on the value of the pull-up resistor tied to the Ready/Busy pin. See Figures 32, 33 and 34.
(2). To break the sequential read cycle, CE must be held High for longer than t
EHEL
.
(3). ES = Electronic Signature.
(4). 1G DDP
t
WHRL
t
WHR
Write Enable High to Read Enable Low
Min
60
ns
t
WLWL
t
WC
Write Enable Low to Write Enable
Low
Write Cycle time
Min
50
80
ns
Alt.
Sym-
bol
Sym-
bol
Parameter
3.3V
Device
1.8V
Device
Unit
Figure 21. Command Latch AC Waveforms
Command
tCLHWL
(CLE Setup time)
tELWL
(CE Setup time)
tHWCLL
(CLE Hold time)
tWHEH
(CE Hold time)
tWLWH
tALLWL
(ALE Setup time)
tWHALH
(ALE Hold time)
tDVWH
(Data Setup time)
tWHDX
(Data Hold time)
CLE
ALE
I/O
CE
WE
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