參數(shù)資料
型號(hào): IDT82V3280EQG
廠商: IDT, Integrated Device Technology Inc
文件頁(yè)數(shù): 88/171頁(yè)
文件大?。?/td> 0K
描述: IC PLL WAN SE STRATUM 2 100TQFP
標(biāo)準(zhǔn)包裝: 90
類型: 時(shí)鐘/頻率發(fā)生器,多路復(fù)用器
PLL:
主要目的: 以太網(wǎng),SONET/SDH,Stratum
輸入: CMOS,LVDS,PECL
輸出: CMOS,LVDS,PECL
電路數(shù): 1
比率 - 輸入:輸出: 14:9
差分 - 輸入:輸出: 是/是
頻率 - 最大: 622.08MHz
電源電壓: 3 V ~ 3.6 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 100-LQFP 裸露焊盤(pán)
供應(yīng)商設(shè)備封裝: 100-TQFP-EP(14x14)
包裝: 托盤(pán)
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)第77頁(yè)第78頁(yè)第79頁(yè)第80頁(yè)第81頁(yè)第82頁(yè)第83頁(yè)第84頁(yè)第85頁(yè)第86頁(yè)第87頁(yè)當(dāng)前第88頁(yè)第89頁(yè)第90頁(yè)第91頁(yè)第92頁(yè)第93頁(yè)第94頁(yè)第95頁(yè)第96頁(yè)第97頁(yè)第98頁(yè)第99頁(yè)第100頁(yè)第101頁(yè)第102頁(yè)第103頁(yè)第104頁(yè)第105頁(yè)第106頁(yè)第107頁(yè)第108頁(yè)第109頁(yè)第110頁(yè)第111頁(yè)第112頁(yè)第113頁(yè)第114頁(yè)第115頁(yè)第116頁(yè)第117頁(yè)第118頁(yè)第119頁(yè)第120頁(yè)第121頁(yè)第122頁(yè)第123頁(yè)第124頁(yè)第125頁(yè)第126頁(yè)第127頁(yè)第128頁(yè)第129頁(yè)第130頁(yè)第131頁(yè)第132頁(yè)第133頁(yè)第134頁(yè)第135頁(yè)第136頁(yè)第137頁(yè)第138頁(yè)第139頁(yè)第140頁(yè)第141頁(yè)第142頁(yè)第143頁(yè)第144頁(yè)第145頁(yè)第146頁(yè)第147頁(yè)第148頁(yè)第149頁(yè)第150頁(yè)第151頁(yè)第152頁(yè)第153頁(yè)第154頁(yè)第155頁(yè)第156頁(yè)第157頁(yè)第158頁(yè)第159頁(yè)第160頁(yè)第161頁(yè)第162頁(yè)第163頁(yè)第164頁(yè)第165頁(yè)第166頁(yè)第167頁(yè)第168頁(yè)第169頁(yè)第170頁(yè)第171頁(yè)
IDT82V3280
WAN PLL
Functional Description
23
December 9, 2008
3.5
INPUT CLOCK QUALITY MONITORING
The qualities of all the input clocks are always monitored in the fol-
lowing aspects:
LOS (loss of signal) (only for IN1 and IN2)
Activity
Frequency
LOS monitoring is only conducted on IN1 and IN2. Activity and fre-
quency monitoring are conducted on all the input clocks.
The qualified clocks are available for T0/T4 DPLL selection. The T0
and T4 selected input clocks have to be monitored further. Refer to
3.5.1
LOS MONITORING
IN1 and IN2 support the AMI input signal. LOS monitoring is con-
ducted on IN1 and IN2. A LOS event occurs when the amplitude of the
input clock falls below +0.6 Vp-p for 1 ms; the LOS event is cleared
when the amplitude rises higher than +1 Vp-p.
LOS status is indicated by the AMI1_LOS 1 / AMI2_LOS 1 bit. If the
AMI1_LOS 2 / AMI2_LOS 2 bit is ‘1’, the occurrence of LOS will trigger
an interrupt.
The input clock in LOS status is disqualified for clock selection for T0/
T4 DPLL.
3.5.2
ACTIVITY MONITORING
Activity is monitored by using an internal leaky bucket accumulator,
as shown in Figure 4.
Each input clock is assigned an internal leaky bucket accumulator.
The input clock is monitored for each period of 128 ms and the internal
leaky bucket accumulator increases by 1 when an event is detected; it
decreases by 1 if no event is detected within the period set by the decay
rate. The event is that an input clock drifts outside (>) ±500 ppm with
respect to the master clock within a 128 ms period.
There are four configurations (0 - 3) for a leaky bucket accumulator.
The leaky bucket configuration for an input clock is selected by the cor-
responding BUCKET_SEL[1:0] bits. Each leaky bucket configuration
consists of four elements: upper threshold, lower threshold, bucket size
and decay rate.
The bucket size is the capability of the accumulator. If the number of
the accumulated events reach the bucket size, the accumulator will stop
increasing even if further events are detected. The upper threshold is a
point above which a no-activity alarm is raised. The lower threshold is a
point below which the no-activity alarm is cleared. The decay rate is a
certain period during which the accumulator decreases by 1 if no event
is detected.
The leaky bucket configuration is programmed by one of four groups
of register bits: the BUCKET_SIZE_n_DATA[7:0] bits, the UPPER_
THRESHOLD_n_DATA[7:0] bits,
the LOWER_THRESHOLD_n_
DATA[7:0] bits and the DECAY_RATE_n_DATA[1:0] bits respectively; ‘n’
is 0 ~ 3.
The no-activity alarm status of the input clock is indicated by the
INn_NO_ACTIVITY_ALARM bit (14
≥ n ≥ 1).
The input clock with a no-activity alarm is disqualified for clock selec-
tion for T0/T4 DPLL.
Figure 4. Input Clock Activity Monitoring
Input Clock
Leaky Bucket Accumulator
No-activity Alarm Indication
Decay
Rate
Bucket Size
Upper Threshold
Lower Threshold
0
clock signal with no event
clock signal with events
相關(guān)PDF資料
PDF描述
VE-B34-MW-F1 CONVERTER MOD DC/DC 48V 100W
VI-JWN-MW-B1 CONVERTER MOD DC/DC 18.5V 100W
VE-B33-MW-F2 CONVERTER MOD DC/DC 24V 100W
IDT82V3280PFG IC PLL WAN SE STRATUM 2 100-TQFP
MS27467E25B19SC CONN PLUG 19POS STRAIGHT W/SCKT
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
IDT82V3280EQG8 制造商:Integrated Device Technology Inc 功能描述:IC PLL WAN SE STRATUM 2 100TQFP
IDT82V3280EQGBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:WAN PLL
IDT82V3280PF 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:WAN PLL
IDT82V3280PFBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:WAN PLL
IDT82V3280PFG 功能描述:IC PLL WAN SE STRATUM 2 100-TQFP RoHS:是 類別:集成電路 (IC) >> 時(shí)鐘/計(jì)時(shí) - 專用 系列:- 標(biāo)準(zhǔn)包裝:1,500 系列:- 類型:時(shí)鐘緩沖器/驅(qū)動(dòng)器 PLL:是 主要目的:- 輸入:- 輸出:- 電路數(shù):- 比率 - 輸入:輸出:- 差分 - 輸入:輸出:- 頻率 - 最大:- 電源電壓:3.3V 工作溫度:0°C ~ 70°C 安裝類型:表面貼裝 封裝/外殼:28-SSOP(0.209",5.30mm 寬) 供應(yīng)商設(shè)備封裝:28-SSOP 包裝:帶卷 (TR) 其它名稱:93786AFT