參數(shù)資料
型號(hào)： MC92600CJUB
廠商： FREESCALE SEMICONDUCTOR INC
元件分類： 微控制器/微處理器
英文描述： SPECIALTY MICROPROCESSOR CIRCUIT, PBGA217
封裝： 23 X 23 MM, 2.32 MM HEIGHT, 1.27 MM PITCH, PLASTIC, BGA-217
文件頁(yè)數(shù)： 47/98頁(yè)
文件大?。?/td> 1288K
代理商： MC92600CJUB
MOTOROLA
Chapter 5. Test Features
5-1
Chapter 5
Test Features
The MC92600 supports several test modes for in-system built-in self test (BIST) and
production testing. Test modes are selected through the TST_0, TST_1, LBE and LBOE
signals. Table 5-1 shows test mode state selection.
5.1
Loop Back System Test
The MC92600 can be congured in loop back mode where the transmitted data is looped
back to its receiver independent of the receiver’s link inputs. This is enabled by setting LBE
high. The characters transmitted are controlled by the normal transmitter controls. If the
transceiver is working properly, the data/control characters transmitted are received by the
receiver. This allows system logic to use various data sequences to test the operation of the
transceiver.
The loop-back signals are electrically isolated from the XLINK_x_P/XLINK_x_N output
signals. Therefore, if the outputs are shorted, or otherwise restricted, the loop-back signals
still operate normally. When in loop-back mode, the LBOE signal controls the action of the
XLINK_x_P/XLINK_x_N output signals. When LBOE is low, the transmit driver holds the
XLINK_x_P/XLINK_x_N output signals high and low, respectively. When LBOE is high,
the XLINK_x_P/XLINK_x_N output signals continue to operate normally.
The receiver’s link input signals, RLINK_x_P and RLINK_x_N, are also electrically
isolated during loop back mode, such that their state does not affect the loop back path.
Table 5-1. Test Mode State Selection
TST_1
TST_0
LBE
LBOE
Description
Low
Normal operation, no test mode enabled
Low
High
Don’t care
Loop back system test mode (Section 5.1)
Low
High
Low
Don’t care
BIST sequence system test mode (Section 5.2)
Low
High
Don’t care
Loop back BIST sequence system test mode (Section 5.3)
Low
High
Board level production test mode (Section 5.4)
High
Don’t care
Reserved
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Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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