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參數(shù)資料
| 型號(hào)： | PEB2445N |
| 廠商： | SIEMENS AG |
| 英文描述： | LTM4600 Evaluation Kit |
| 中文描述： | ？多點(diǎn)交換和會(huì)議股-衰減？ |
| 文件頁(yè)數(shù)： | 56/70頁(yè) |
| 文件大?。?/td> | 1236K |
| 代理商： | PEB2445N |
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PEB 2445
Electrical Characteristics
Semiconductor Group
56
02.96
5
Electrical Characteristics
Note: Stresses above those listed here may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Maximum ratings are absolute ratings; exceeding only one of these values may
cause irreversible damage to the integrated circuit.
5.1
T
A
= 0 to 70
°
C;
V
DD
= 5 V
±
5 %,
V
SS
= 0 V
DC Characteristics
Note: The listed characteristics are ensured over the operating range of the integrated
circuit. Typical characteristics specify mean values expected over the production
spread. If not otherwise specified, typical characteristics apply at
T
A
= 25
°
C and
the given supply voltage.
Absolute Maximum Ratings
Parameter
Ambient temperature under bias: PEB
Storage temperature
Voltage on any pin with respect to ground
Maximum voltage on any pin
Symbol
T
A
T
stg
V
S
V
max
Limit Values
0 to 70
65 to 125
0.4 to
V
DD
+ 0.4
7
Unit
°
C
°
C
V
V
Parameter
Symbol
Limit Values
min.
0.4
2.0
2.7
Unit Test Condition
max.
0.8
V
DD
+ 0.4
V
DD
+ 0.4
0.45
L-input voltage
H-input voltage
V
IL
V
IH
V
CLK and WR only
I
OL
= 2 mA
I
OH
=
400
μ
A
I
OH
=
100
μ
A
L-output voltage
H-output voltage
H-output voltage
Power
supply
current
Input leakage current
Output leakage current
Input leakage current at
inputs with internal pull-
down
V
OL
V
OH
V
OH
V
V
V
2.4
V
DD
0.5
operational
CLK = 4 MHz
CLK = 8 MHz
I
CC
I
CC
I
LI
I
LO
I
LPD
5
10
10
mA
mA
μ
A
V
DD
= 5 V, Inputs at 0 V
or
V
DD
, no output loads
0 V <
V
IN
<
V
DD
to 0 V
0 V <
V
OUT
<
V
DD
to 0 V
0 V <
V
IN
<
V
DD
to 0 V
RES, ALE, A0, A1 only
700
μ
A
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