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參數(shù)資料
| 型號： | Q67103-H6594 |
| 廠商： | SIEMENS AG |
| 英文描述： | Memory Time Switch Extended Large MTSXL |
| 中文描述： | 內存定時開關擴展大型MTSXL |
| 文件頁數(shù)： | 19/51頁 |
| 文件大?。?/td> | 1052K |
| 代理商： | Q67103-H6594 |
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PEB 2447
Functional Description
Semiconductor Group
19
03.97
The extended TAP controller uses a modified data path:
Table 4
Data Path of 4 Bit TAP Controller
Instruction Code
Input
11xx
TDI
00xx
BSOUT
0011
BSOUT_ID
01xx
TDI2: STAR:STOK (internal)
10xx
TDI3: VSS (not used, internal)
When TAP_TEST1 / 2 is activated the data path is set to shift the result of the selftest
procedure (bit STAR:STOK) out through the TDO pin.
2.3.3
The built in self test is used by the following steps:
– The instruction TAP_TEST2 is shifted into the TAP controller (see
figure 4
)
– STP command is shifted into the selftest control register (see
table 5
and
figure 5
)
– The instruction TAP_TEST1 is shifted into the TAP controller to start the selftest
(see
figure 6
) after 10240 TCK periods:
– Bit STAR:STOK can be shifted out (see
figure 7
)
.
Table 5
4 Bit Selftest Control Register
Bit
Function
ST [0]
CMDR:STP0
ST [1]
CMDR:STP1
ST [2]
CMDR:STP2
ST [3]
“1” built in selftest
“0” no built in selftest
Use of Built in Selftest via the Boundary Scan Interface
Note:
ST [2:0] represent the bits CMDR:STP2..0 but do not overwrite them.
Data Path
→
→
→
→
→
Output
TDO
TDO
TDO
TDO
TDO
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