- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄373637 > TH58100FT (Toshiba Corporation) TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS PDF資料下載
參數(shù)資料
| 型號： | TH58100FT |
| 廠商： | Toshiba Corporation |
| 英文描述： | TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS |
| 中文描述： | 馬鞍山暫定東芝數(shù)字集成電路硅柵CMOS |
| 文件頁數(shù)： | 25/43頁 |
| 文件大?。?/td> | 421K |
| 代理商： | TH58100FT |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁當前第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁第39頁第40頁第41頁第42頁第43頁
TH58100FT
2001-03-05 25/43
Status Read
The device has two Status Read commands. One is Status Read (1) command “70H” and the other is Status
Read (2) command “71H”.
The device automatically implements the execution and verification of the Program and Erase operations. The
Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass/fail) of a
Program or Erase operation, and determine whether the device is in Protect mode. The device status is output
via the I/O port on the
RE
clock after a Status Read command “70H” or “71H” input.
The resulting information of Status Read (1) command “70H” is outlined in Table 5 below and the resulting
information of Status Read (2) command “71H” is outlined in the explanation for Multi Block Program and Multi
Block Erase toward the end of this document.
Table 5. Status output table for Status Read (1) command “70H”
STATUS
OUTPUT
I/O1
Pass/Fail
Pass: 0
Fail: 1
I/O2
Not Used
0
I/O3
Not Used
0
I/O4
Not Used
0
I/O5
Not Used
0
I/O6
Not Used
0
I/O7
Ready/Busy
Ready: 1
Busy: 0
I/O8
Write Protect
Protect: 0
Not Protected: 1
The Pass/Fail status on I/O1 is only
valid when the device is in the Ready
state.
An application example with multiple devices is shown in Figure 6.
System Design Note: If the
diagram, the Status Read function can be used to determine the status of each individual device.
BY
/
RY
pin signals from multiple devices are wired together as shown in the
Device
1
CLE
ALE
WE
RE
1
CE
Device
2
2
CE
Device
3
3
CE
Device
N
N
CE
Device
N 1
1
N
CE
I/O1
to I/O8
RY
BY
/
WE
RE
Status on Device 1
70H
1
CE
ALE
I/O
70H
Status on Device N
BY
/
RY
CLE
N
CE
Figure 6. Status Read timing application example
Busy
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| TH58NVG1S3AFT | TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS |
| TH58NVG1S3AFT05 | TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS |
| TH7804A | 50 AMP LATCHING POWER RELAY |
| TH7804ACC | 50 AMP LATCHING POWER RELAY |
| TH7813A | 50 MHz 1024/2048 Linear CCDs |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| TH58512DC-T051(Y) | 制造商:Toshiba America Electronic Components 功能描述:IC E2PROM NAND 3V 512MBIT FDC22A |
| TH58BVG3S0FTAI0 | 制造商:Toshiba America Electronic Components 功能描述:8GB SLC NAND TSOP 32NM (EEPROM) - Trays |
| TH58BYG2S3HBAI4 | 制造商:Toshiba America Electronic Components 功能描述:4GB SLC BENAND 24NM BGA 9X11 1 |
| TH58BYG2S3HBAI6 | 制造商:Toshiba America Electronic Components 功能描述:4GB SLC BENAND 24NM BGA 6.5X8 1.8V (EEPROM) 2K PAGE - Trays |
| TH58DVG4S0ETA20 | 制造商:Toshiba America Electronic Components 功能描述: |
發(fā)布緊急采購，3分鐘左右您將得到回復。