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參數(shù)資料
| 型號： | AM29LV256MH128EI |
| 廠商： | ADVANCED MICRO DEVICES INC |
| 元件分類： | PROM |
| 英文描述： | 16M X 16 FLASH 3V PROM, 120 ns, PDSO56 |
| 封裝： | TSOP-56 |
| 文件頁數(shù)： | 42/63頁 |
| 文件大?。?/td> | 1515K |
| 代理商： | AM29LV256MH128EI |
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September 9, 2002
Am29LV256M
47
A D VA NCE
I N FO RM ATIO N
TEST CONDITIONS
Table 12.
Test Specifications
Note: If VIO < VCC, the reference level is 0.5 VIO.
KEY TO SWITCHING WAVEFORMS
2.7 k
CL
6.2 k
3.3 V
Device
Under
Test
Note: Diodes are IN3064 or equivalent.
Figure 11.
Test Setup
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–3.0
V
Input timing measurement
reference levels (See Note)
1.5
V
Output timing measurement
reference levels
0.5 V
IO
V
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
0.5 VIO V
Output
Measurement Level
Input
Note: If V
IO < VCC, the input measurement reference level is 0.5 VIO.
Figure 12.
Input Waveforms and
Measurement Levels
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