參數(shù)資料
型號: CAT28F512
英文描述: 512K-Bit CMOS Flash Memory(512K(64K x 8位)位CMOS閃速存儲器)
中文描述: 為512k位CMOS閃存(為512k(64K的× 8位)位的CMOS閃速存儲器)
文件頁數(shù): 3/14頁
文件大?。?/td> 97K
代理商: CAT28F512
CAT28F512
3
Preliminary
Doc. No. 25042-00 2/98 F-1
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................... –55
°
C to +95
°
C
Storage Temperature....................... –65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
........... –2.0V to +V
CC
+ 2.0V
Voltage on Pin A
9
with
Respect to Ground
(1)
................... –2.0V to +13.5V
V
PP
with Respect to Ground
during Program/Erase
(1)
.............. –2.0V to +14.0V
V
CC
with Respect to Ground
(1)
............ –2.0V to +7.0V
Package Power Dissipation
Capability (T
A
= 25
°
C) .................................. 1.0 W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100 mA
RELIABILITY CHARACTERISTICS
Symbol
N
END(3)
Parameter
Min.
Max.
Units
Test Method
Endurance
100K
Cycles/Byte
MIL-STD-883, Test Method 1033
T
DR(3)
Data Retention
10
Years
MIL-STD-883, Test Method 1008
V
ZAP(3)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
I
LTH(3)(4)
Latch-Up
100
mA
JEDEC Standard 17
CAPACITANCE
T
A
= 25
°
C, f = 1.0 MHz
Limits
Symbol
C
IN(3)
Test
Min
Max.
Units
Conditions
Input Pin Capacitance
6
pF
V
IN
= 0V
C
OUT(3)
Output Pin Capacitance
10
pF
V
OUT
= 0V
C
VPP(3)
V
PP
Supply Capacitance
25
pF
V
PP
= 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
CC
+1V.
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
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