參數(shù)資料
型號: K9K4G08U1M
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 256M x 8 Bit / 128M x 16 Bit / 512M x 8 Bit NAND Flash Memory
中文描述: 256M × 8位/ 128M的× 16位/ 512M × 8位NAND閃存
文件頁數(shù): 15/40頁
文件大小: 839K
代理商: K9K4G08U1M
FLASH MEMORY
15
Preliminary
K9F2G08U0M K9F2G16U0M
K9K4G08U1M
NAND Flash Technical Notes
(Continued)
Program Flow Chart
Start
I/O 6 = 1
or R/B = 1
I/O 0 = 0
No
*
Write 80h
Write Address
Write Data
Write 10h
Read Status Register
Program Completed
Program Error
Yes
No
Yes
Error in write or read operation
Within its life time, additional invalid blocks may develop with NAND Flash memory. Refer to the qualification report for the block
failure rate.The following possible failure modes should be considered to implement a highly reliable system. In the case of status
read failure after erase or program, block replacement should be done. Because program status fail during a page program does not
affect the data of the other pages in the same block, block replacement can be executed with a page-sized buffer by finding an
erased empty block and reprogramming the current target data and copying the rest of the replaced block. In case of Read, ECC
must be employed. To improve the efficiency of memory space, it is recommended that the read failure due to single bit error should
be reclaimed by ECC without any block replacement. The block failure rate in the qualification report does not include those
reclaimed blocks.
Failure Mode
Detection and Countermeasure sequence
Write
Erase Failure
Status Read after Erase --> Block Replacement
Program Failure
Status Read after Program --> Block Replacement
Read
Single Bit Failure
Verify ECC -> ECC Correction
ECC
: Error Correcting Code --> Hamming Code etc.
Example) 1bit correction & 2bit detection
: If program operation results in an error, map out
the block including the page in error and copy the
*
target data to another block.
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參數(shù)描述
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K9K8G08U0A-P 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:1G x 8 Bit / 2G x 8 Bit NAND Flash Memory
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