2-56 Revision 11 Table 2-71 A3PN125 Global Resource Commercial-Case Condit" />
參數(shù)資料
型號(hào): A3PN250-ZVQG100
廠商: Microsemi SoC
文件頁數(shù): 83/114頁
文件大小: 0K
描述: IC FPGA NANO 250K GATES 100-VQFP
標(biāo)準(zhǔn)包裝: 90
系列: ProASIC3 nano
RAM 位總計(jì): 36864
輸入/輸出數(shù): 68
門數(shù): 250000
電源電壓: 1.425 V ~ 1.575 V
安裝類型: 表面貼裝
工作溫度: 0°C ~ 70°C
封裝/外殼: 100-TQFP
供應(yīng)商設(shè)備封裝: 100-VQFP(14x14)
ProASIC3 nano DC and Switching Characteristics
2-56
Revision 11
Table 2-71 A3PN125 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description
–2
–1
Std.
Units
Min. 1 Max. 2 Min. 1 Max. 2 Min. 1 Max. 2
tRCKL
Input LOW Delay for Global Clock
0.76
0.99
0.87
1.12
1.02
1.32
ns
tRCKH
Input HIGH Delay for Global Clock
0.76
1.02
0.87
1.17
1.02
1.37
ns
tRCKMPWH Minimum Pulse Width HIGH for Global Clock
0.75
0.85
1.00
ns
tRCKMPWL
Minimum Pulse Width LOW for Global Clock
0.85
0.96
1.13
ns
tRCKSW
Maximum Skew for Global Clock
0.26
0.30
0.35
ns
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects maximum load. The delay is measured on the clock pin of the farthest sequential element, located in a fully
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage-supply levels, refer to Table 2-6 on page 2-5 for derating values.
Table 2-72 A3PN250 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description
–2
–1
Std.
Units
Min. 1 Max. 2 Min. 1 Max. 2 Min. 1 Max. 2
tRCKL
Input LOW Delay for Global Clock
0.79
1.02
0.90
1.16
1.06
1.36
ns
tRCKH
Input HIGH Delay for Global Clock
0.78
1.04
0.88
1.18
1.04
1.39
ns
tRCKMPWH Minimum Pulse Width HIGH for Global Clock
0.75
0.85
1.00
ns
tRCKMPWL
Minimum Pulse Width LOW for Global Clock
0.85
0.96
1.13
ns
tRCKSW
Maximum Skew for Global Clock
0.26
0.30
0.35
ns
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects maximum load. The delay is measured on the clock pin of the farthest sequential element, located in a fully
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage-supply levels, refer to Table 2-6 on page 2-5 for derating values.
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