參數(shù)資料
型號: TS83102G0BMGS
廠商: E2V TECHNOLOGIES PLC
元件分類: ADC
英文描述: 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CBGA152
封裝: 21 X 21 MM, 1.27 MM PITCH, HERMETIC SEALED, CERAMIC, CGA-152
文件頁數(shù): 39/54頁
文件大?。?/td> 2622K
代理商: TS83102G0BMGS
44
0935B–BDC–06/08
TS83102G0BMGS
e2v semiconductors SAS 2008
9.7.4
Pattern Generator Function
The pattern generator function (enabled by connecting pin A9 PGEB to V
EE = 5V) allows you to rapidly
check the ADC’s operation thanks to a checker board pattern delivered internally to the ADC. Each of
the ADC’s output bits should toggle from 0 to 1
successively, giving sequences such as 0101010101 and 1010101010 every 2 cycles.
The out of range bit also toggles when the pattern generator is active. Even bits as well as the out of
range bit are low on low to high transition of the data ready signal.
9.7.5
DECB/DIODE: Junction Temperature Monitoring and Output Decimation Enable
The DECB/DIODE pin is provided to enable the decimation function and monitor the die junction
temperature.
When connected to V
EE = 5V, the ADC runs in “decimation by 32” mode (1 out of 32 data is output from
the ADC, thus reducing the data rate by 32).
When the DECB/DIODE pin is left floating, then the ADC is said to be in a "normal" mode of operation
(the output data is not decimated) and can be used for die junction temperature monitoring only.
If you do not intend to use the die junction temperature monitoring function, the DECB/DIODE pin (A10)
has to be left either floating or connected to ground.
The decimation function can be used to debug the ADC at initial stages. This function enables you to
reduce the ADC output rate by 32, thus reducing the time of the ADC’s debug phase at the maximum
speed rate, and is compatible with industrial testing environments.
When this function is active, the ADC outputs only 1 out of 32 bits of data, resulting in a data rate 32
times slower than the clock rate.
Note:
The ADC decimation test mode is different from the pattern generator function, which is used to check the
ADC’s outputs.
9.7.6
External Configuration Description
Because of the use of one internal diode-mounted transistor (used for junction temperature monitoring),
you have to implement external head-to-tail protection diodes so as to avoid potential reverse current
flows, which can damage the internal diode component.
Two external configurations are possible:
Configuration 1: allows both junction temperature monitoring and output data decimation
Configuration 2: allows junction temperature monitoring only
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