參數(shù)資料
型號: 24850
英文描述: Parasite-Power Digital Thermometer
中文描述: Socket 754的設(shè)計(jì)和資格要求
文件頁數(shù): 29/40頁
文件大小: 2405K
代理商: 24850
24850 Rev. 3.07 August 2003
7
Electrical Qualification Requirements
Socket 754 Design and Qualification Requirements
7.1
All test fixtures that are required to conduct the electrical qualification requirements will be furnished
by AMD to the AMD designated testing facility.
Fixture
7.1.1
Capacitance and Inductance Matrices
The partial “l(fā)oop” inductance and Maxwell capacitance matrices (see Section 7.6 on page 36 for
definitions) are measured for the three mated pin configurations shown in
Figure 6
on page 29. For the
pin configurations, the size of the Maxwell capacitance matrix is 2 x 2, as is the size of the partial
“l(fā)oop” inductance matrix.
Figure 6. Pin Configuration for the Maxwell Capacitance and Partial Inductance Matrix
Measurement
7.1.2
Mated Partial Self Inductance
The following procedures are required to properly test for mated partial self-inductance.
7.1.2.1
Test Procedure
Use a validated “industry-standard” 3-D EM field solver. This is the only quantity in the specification
that need not be measured. Values obtained from an accurate detailed 3-D EM field solver model are
acceptable. This computed quantity must not be used in any calculations involving measured data.
Chapter 7
Electrical Qualification Requirements
29
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