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參數(shù)資料
| 型號： | 24850 |
| 英文描述： | Parasite-Power Digital Thermometer |
| 中文描述： | Socket 754的設(shè)計和資格要求 |
| 文件頁數(shù)： | 34/40頁 |
| 文件大?。?/td> | 2405K |
| 代理商： | 24850 |
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Socket 754 Design and Qualification Requirements
24850 Rev. 3.07 August 2003
Figure 9. Pin Configurations for the Propagation Delay Skew Measurements of Single-Ended
Signals
Each measurement consists of driving one (gray-shaded) pin as signal and using the center pin (blue)
as return. The propagation delay skew for all signal pins in Figure 9(a) are measured. The maximum
allowable deviation for all the pins in the array must be less than the specified value. An identical set
of measurements must also be repeated for the pin array shown inFigure 9(b).
The differential propagation delay skew is measured for every pin configuration shown in Figure 6 on
page 29.. In each measurement the two gray-shaded pins (denoted 1 and 2) and driven as signals in
differential form, using the blue pin as ground. The maximum allowable deviation in the propagation
delay skew for all specified pin configurations must be less than the specified value.
7.4.1
Single Ended Propagation Delay Skew
The following procedures are required to properly test for single ended propagation delay.
7.4.1.1
Test Procedure
Use the procedures shown in EIA-364-103 for testing the single ended propagation delay skew.
Propagation delay skew can also be measured using a time delay reflectometer (TDR) by launching the
signals through the designated pins, such as those inFigure 9. The signals are launched from the
interposer and the delay skew is observed at the test board. The difference in the propagation times
(delay skew) through different pins in the socket can be clearly seen and measured at the open
circuited end of the test board.
34
Electrical Qualification Requirements
Chapter 7
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